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Letter to the Editors of Metallography, Microstructure and Analysis

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Metallography, Microstructure, and Analysis Aims and scope Submit manuscript

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References

  1. Joint Committee for Guides in Metrology. http://www.iso.org/sites/jcgm/jcgm-introduction.htm. Accessed 8 Dec 2013

  2. D.E. Newbury, W.M. Ritchie, Is scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) quantitative? Scanning 35, 141–168 (2013)

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  3. W.M. Ritchie, D.E. Newbury, Uncertainty estimates for electron probe X-ray microanalysis measurements. Anal. Chem. 84, 9956–9962 (2012)

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Authors and Affiliations

  1. Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY, 12180, USA

    Dan Lewis

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  1. Dan Lewis
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Correspondence to Dan Lewis.

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Lewis, D. Letter to the Editors of Metallography, Microstructure and Analysis. Metallogr. Microstruct. Anal. 3, 3–4 (2014). https://doi.org/10.1007/s13632-013-0111-7

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  • DOI: https://doi.org/10.1007/s13632-013-0111-7

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