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Testing and performance analysis of high frequency source under vibrational stress screening

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Abstract

The purpose of this article is to understand significance of random vibration stress screening for high frequency source module. Analysis of random vibration test with their impact on complex frequency source module performance is explained. Importance of sensitive component, structural analysis and design compensation for frequency source module are explained for random vibration test. Analysis of practically observed performance degradation results of frequency source during vibration testing is done. Performance stabilization of frequency source achieved through prior analysis, usage of filtering mechanisms and removal of measurement errors using well-defined procedure is disclosed. Solutions leads to development of frequency module performance as per design during testing.

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References

  • Application note on “Environmental Stress Screening”, Weiss Technik North America, Inc

  • Hati A, Nelson CW, Howe DA (2009) Vibration-induced PM and AM noise in microwave components. IEEE Transactions on Ultrasonic, Ferroelectrics, and Frequency Control (2009)

  • Howe DA, Lanfranchi J, Cutsinger L, Hati A, Nelson CW (2005) Vibration-induced PM noise in oscillators and measurements of correlation with vibration sensors. In: Proceedings of IEEE Frequency Control Symposium, pp 494–498

  • Kosinski JA, Ballato A (1993) Designing for low acceleration sensitivity. IEEE Trans Ultrasonic Ferroelectr Freq Control 40(5):532–537

    Article  Google Scholar 

  • Kouveliotis NK et al. (2004) Experimental Investigation of the field conditions in a vivrating intrinsic reverberation chamber. MOTL, 40(1), 35–38

  • Kumar V et al. (2018) Stabilization of phase noise of PLL system under random vibration environment. In: 2018 IEEE MTT-S International Microwave and RF Conference (IMaRC), Kolkata, India, pp 1–4. V

  • Kumar V, Sarkar M (2019) Analysis of random vibration testing & precautions for failure avoidance. In: 2019 IEEE Asia-Pacific Microwave Conference (APMC), Singapore, Singapore, pp 880–88

  • Lakshminarayanan V (2001) Environmental-stress screening improves electronic-design reliability. EDN, pp 73–84, www.ednmag.com

  • Li NM, Das D (2016) Critical review of U.S. military environmental stress screening (ESS) Handbook. 978–1–5090–1880–2/16/$31.00 ©2016 IEEE

  • Lutes LD, Sarkani S (2004) Random vibrations: analysis of structural and mechanical systems. Elsevier, Amsterdam

    Google Scholar 

  • Nigam NC (1983) Introduction to random vibrations. MIT Press, Massachusetts

    Google Scholar 

  • Peiravi A (2009) Design of halt and environmental stress screening procedures for high reliability electronic products to reduce life cycle costs. Australian J Basic Appl Sci, 3(3): 1800–1813. ISSN 1991–8178.

  • Rosati J, Filler RL (1981) Reduction of the effects of vibration on sc-cut quartz crystal oscillators. In: Proceedings of IEEE Frequency Control Symposium, pp 117–121

  • Tustin W (2005) Random vibration & shock testing. Equipment Reliability Institute, Santa Barbara, CA

    Google Scholar 

  • Walls FL, Felton CM, Martin TD (1990) High Spectral Purity X-Band Source. In: Proceedings of the 44th annual frequency control symposium (FCS), 23–25, Baltimore, Maryland, USA (IEEE 90CH2818–3), pp 542–547

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Acknowledgements

The author acknowledges Manjunath R, Senior DGM and Sivakumar R, DGM Product Development & Innovation Centre (PDIC), Bharat Electronics Limited, India for their assistance and support to carry out the design, testing and analysis. The author also thanks people who were involved directly or indirectly in this work and had given valuable suggestions.

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There is no specific funding received for this work.

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Correspondence to Vipin Kumar.

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Kumar, V. Testing and performance analysis of high frequency source under vibrational stress screening. Int J Syst Assur Eng Manag 13 (Suppl 2), 895–903 (2022). https://doi.org/10.1007/s13198-021-01290-w

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  • DOI: https://doi.org/10.1007/s13198-021-01290-w

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