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Fault diagnosis of discrete-event systems under a general architecture

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Abstract

Diagnosability is an important characteristic indicator to determine whether the system is stable and reliable. In this paper, the general architecture of event-state-combination diagnosability is investigated. The contributions are threefold. First, the notion of event-state-combination diagnosability is formalized. Roughly speaking, an event-state-combination diagnosable system means that not only each combined fault can be detected, but also the system can determine whether it will work permanently in the failure states after the combined fault occurs. Then, an automaton with new information structure, called event-state-combination verifier, is constructed, which can be used for the verification of the event-state-combination diagnosability. Finally, the necessary and sufficient conditions for verifying whether the system is event-state-combination diagnosable is presented, that is, the event-state-combination verifier does not have any failure confused cycle.

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Notes

  1. Failure events and failure states are independent of each other, which means that the occurrence of failure events in the system does not mean that the system is currently working in the failure states. Similarly, the system is currently working in the failure states do not mean that failure events have occurred. i.e., the system is composed of the sub-system A containing failure events and the sub-system B containing failure states.

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Acknowledgements

This work was supported by National Natural Science Foundation of China (61673122), Natural Science Foundation of Guangdong (2019A1515010548), Deanship of Scientific Research at King Saud University (Research Group no. RG-1441-331), and Dongguan social science and technology development project(2020507156694).

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Authors and Affiliations

  1. School of Computers, Guangdong University of Technology, Guangzhou, 510006, China

    Jianxin Tan, Fuchun Liu & Rui Zhao

  2. Network Information Center, Guangdong University of Finance and Economics, Guangzhou, 510320, China

    Jianxin Tan

  3. School of Computer Engineering, Nanjing Institute of Technology, Nanjing, 211167, China

    Yuan Tian

  4. Department of Computer Science, King Saud University, Riyadh, 12271, Saudi Arabia

    Najla Al-Nabhan

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  1. Jianxin Tan
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  2. Fuchun Liu
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  3. Rui Zhao
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  4. Yuan Tian
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  5. Najla Al-Nabhan
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Correspondence to Fuchun Liu.

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Tan, J., Liu, F., Zhao, R. et al. Fault diagnosis of discrete-event systems under a general architecture. J Ambient Intell Human Comput (2021). https://doi.org/10.1007/s12652-020-02835-w

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