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Propagation of elliptical Gaussian beams carrying mixed screw–edge dislocations through uniaxial crystals

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Abstract

The propagation expressions of elliptical Gaussian beams carrying mixed screw–edge dislocations through a uniaxial crystal orthogonal to the optical axis are derived. The effects of the source beam and crystal on the intensity and phase of such beams during propagation are discussed in detail. The obtained results show that the intensity profiles of elliptical and circular Gaussian beams carrying mixed screw–edge dislocations in uniaxial crystals are controlled by the beam parameter ratio of the waist width, edge dislocations, off-axis distance and ratio of the refractive indices of uniaxial crystals.

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Acknowledgements

This work was supported by National Key R&D Program Project ‘Intersatellite Laser Communication Measurement Inte-grated System Technology’ (2022YFB3902505), the National Natural Science Foundation of China under Grant 62201307, 111 Project of China (D21009) and the Major Key Project of PCL (PCL2021A03-1).

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Authors and Affiliations

  1. Fundamental Science on Space-Ground Laser Communication Technology Laboratory, Changchun University of Science and Technology, Changchun, 130022, China

    Liang Gao, Songyan Song & Keyan Dong

  2. Peng Cheng Laboratory, Shenzhen, 518000, China

    Jiayin Xue, Yiqun Zhang & Songyan Song

  3. China Academy of Space Technology, Xi’an, 710000, China

    Bin Ren

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  1. Liang Gao
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  2. Jiayin Xue
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  3. Yiqun Zhang
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  4. Songyan Song
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  5. Keyan Dong
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  6. Bin Ren
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Correspondence to Jiayin Xue.

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Gao, L., Xue, J., Zhang, Y. et al. Propagation of elliptical Gaussian beams carrying mixed screw–edge dislocations through uniaxial crystals. Indian J Phys 97, 4417–4425 (2023). https://doi.org/10.1007/s12648-023-02771-3

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  • DOI: https://doi.org/10.1007/s12648-023-02771-3

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