Abstract
ZnS nanoparticles within the range 3–6 nm have been synthesized by simple chemical method using polyvinyl alcohol as matrix. X-ray diffraction has been used for determining structures of ZnS nanocrystals along with high resolution transmission electron microscopy. For all deposited films the preferential orientation is along (111) direction with some other planes (220) and (311). The grain sizes of the particles have been calculated using both Scherrer’s formula and Williamson–Hall plot. The lattice constant ‘a’ have been obtained using Nelson–Riley plot. The average internal stress, microstrain, dislocation density and degree of preferred orientation in the films are calculated and correlated with molarities of the films.
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Acknowledgments
The authors are thankful to Department of Physics, Department of Nanotechnology and CIF, IIT Guwahati for providing XRD and TEM facilities.
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Barman, B., Sarma, K.C. Structural characterization of PVA capped ZnS nanostructured thin films. Indian J Phys 86, 703–707 (2012). https://doi.org/10.1007/s12648-012-0116-0
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DOI: https://doi.org/10.1007/s12648-012-0116-0