Size quantification of sub-micron ZnSe semiconductor particles by laboratory scattering methods

Abstract

A novel route has been developed to synthesize sub-micron Zinc Selenide semiconductor particles through elemental solvothermal process. Transparent polyvinyl alcohol matrix was chosen as host material for embedding these ZnSe particles in order to stop agglomeration of the particles as well as to facilitate optical characterization. Structural and morphological characterizations were carried out through high resolution electron microscopy and UV-vis spectroscopy. In order to understand light scattering phenomena of these particles, they were investigated by a custom made set up which uses a He-Ne laser of wavelength 632.8nm and an array of Silicon photodetectors. An attempt was made to experimentally determine the most significant element of the Mueller scattering matrix. Novel computational technique, involving single scattering for spherical particles using T-matrix theory was applied. The analysis of the experimental data was done by the method of comparison with theoretically generated data. The theoretical prediction was found to agree well qualitatively with the experimental data. Our results validitate that within an acceptable margin of error of the experimental results, the combination of experimental setup and associated computational method is an efficient and reliable in-situ system for size quantification of sub- micron semiconductor particles in the laboratory.