MAPAN

pp 1–10 | Cite as

Testing of Accelerometer Transverse Sensitivity Using Elliptical Orbits

Original Paper

Abstract

For appropriate application of an accelerometer, it is required to test the accurate magnitude and direction of its transverse sensitivity. The current testing methods usually adopt circular and linear orbits as acceleration inputs, both of which require accurate relative phases and amplitudes of the acceleration components. The elliptical orbit however is much easier to obtain. The method of determining the transverse sensitivity by an ellipse in proportion with the motion orbit and a straight line passing through the origin is investigated. The results of the elliptical orbit method match well with the current circular orbit method and have a good consistency at different shapes and orientations of elliptical orbits.

Keywords

Elliptical orbit Transverse sensitivity Sensitivity component Accelerometer 

Notes

Acknowledgements

This research is sponsored by National Natural Science Foundation of China (No. 51605461) and Quality Inspection Public Welfare Industry Research Project (No. 201410009).

References

  1. [1]
    ISO 16063-31, Methods for the calibration of vibration and shock transducers—Part 31: Testing of transverse vibration sensitivity (2009).Google Scholar
  2. [2]
    T. Petzsche, Determination of the transverse sensitivity using a mechanical vibration generator with turntable. ISO TC 108/SC 3/WG 6 Doc. N153 (2007).Google Scholar
  3. [3]
    C.S. Veldman, Implementation of an accelerometer transverse sensitivity measurement system, Test and measurement conference (2012).Google Scholar
  4. [4]
    J.J. Dosch, D.M. Lally, Automated testing of accelerometer transverse sensitivity, http://www.modalshop.com/techlibrary/JDosch%20transverse%20calibration.pdf (2000).
  5. [5]
    R.D. Sill, E.J. Seller, Accelerometer transverse sensitivity measurement using planar orbital motion, Proceedings of the 77th shock and vibration symposium, Monterey, CA, USA (2006) pp. 8–12.Google Scholar
  6. [6]
    W. Guan, X.F. Meng, X.M. Dong, Accelerometer transverse sensitivity testing with double turntable centrifuge, The I2MTC 2014 conference, Montevideo, Uruguay (2014), pp. 578–582.Google Scholar
  7. [7]
    W. Guan, X.F. Meng, X.M. Dong, Testing transverse sensitivity of linear single-axis pendulous accelerometer with double turntable centrifuge, MAPAN-J. Metrol. Soc India, 31 (2016) 69–74.Google Scholar
  8. [8]
    IEEE 836-2009, IEEE recommended practice for precision centrifuge testing of linear accelerometers (2009).Google Scholar
  9. [9]
    T. Usuda, H.J. Martens, C. Weißenborn, Theoretical and experimental investigation of transverse sensitivity of accelerometers under multiaxial excitation, Meas. Sci. Technol., 15 (2004) 896–904.ADSCrossRefGoogle Scholar
  10. [10]
    A. Umeda, M. Onoe, K. Sakata, et al., Calibration of three-axis accelerometers using a three-dimensional vibration generator and three laser interferometers, Sensors and Actuators A, 114 (2004) 93–101.CrossRefGoogle Scholar
  11. [11]
    IEC 60747-14-4, Semiconductor devices—Discrete devices—Part 14-4: Semiconductor accelerometers (2011).Google Scholar
  12. [12]
    ISO 16063-1, Methods for the calibration of vibration and shock transducers—Part 1: Basic concepts (1998).Google Scholar
  13. [13]
    S. Gilbert, Introduction to linear algebra, Cambridge Press, Wellesley, (1994) pp. 330–335.Google Scholar
  14. [14]
    IEEE STD-1057, IEEE Standard for digitizing waveform recorders (1994).Google Scholar

Copyright information

© Metrology Society of India 2018

Authors and Affiliations

  • Zhihua Liu
    • 1
  • Chenguang Cai
    • 1
  • Mei Yu
    • 1
  • Mengmeng Dong
    • 2
  1. 1.National Institute of MetrologyBeijingChina
  2. 2.Beijing University of Chemical TechnologyBeijingChina

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