Abstract
A new n-channel recessed Metal semiconductor field effect transistor (MESFET) with different materials is designed for high power applications in Multi Input Multi Output (MIMO) systems in this paper. Based on material properties and electrical characteristics of MESFET, a SPICE model of the proposed device is developed. For high performance power switches, the power MESFETs are used in most of the applications. The employability of the technology is validated by the electrical measurements of the device. The operational mechanism has been shown by the characterizations done on the proposed device. To optimize the electrical performance, the contact resistance technique has to be enhanced. In this work, the output power and Gain compression of proposed n-channel MESFET at 100 MHz and 1 GHz for high input power is obtained. The output power at fundamental frequency of operation for high input power is also obtained.
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References
Honda H, Ogata M, Sawazaki H, Ono S, Arai M (2003) RF characteristics of short-channel SiC MESFETs. Mater Sci Forum 433–436:745–749
Ohyama H, Takakura K, Umemura K, Shigaki K, Kudou T, Arai M, Kuboyama S, Mastuda S, Kamezawa C, Simoen E, Claeys C (2006) Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation. Phys B 376–377:382–384
Weatherford TR, McMorrow D, Curtice WR, Knudson AR, Campbell AB (1993) Single event induced charge transport modeling of GaAs MESFETs. IEEE Trans Nucl Sci 40:1867–1871
Aditya M, Rao KS, Sravani KG et al (2021) Simulation and drain current performance analysis of high-K gate dielectric FinFET. Silicon. https://doi.org/10.1007/s12633-021-01176-3
Nishiguchi M, Hashinaga T, Nishizawa H, Hayashi H, Okazaki N, Kitagawa M, Fujino T (1990) Radiation tolerant GaAs MESFET with a highly-doped thin active layer grown by OMVPE. IEEE Trans Nucl Sci 37:2071–2075
Laird JS, Toshio H, Shinobu O, Hisayoshi I (2005) High-injection carrier dynamics generated by MeV heavy ions impacting high-speed photodetectors. J Appl Phys 98:013530
Aditya M, Rao KS (2021) Design and performance analysis of advanced MOSFET structures. Trans Electr Electron Mater. https://doi.org/10.1007/s42341-021-00338-9
Dutta S (2018) A theoretical study on the temperature-dependent RF performance of a SiC MESFET. Int J Electron 105(7):1117–1128
Aditya M, Srinivasa Rao K, Sravani K, Guha K (2021) Design, simulation and analysis of high-K gate dielectric FinField effect transistor. International Journal of Nano Dimension 12(3):305–309. https://doi.org/10.22034/ijnd.2021.681554
Djeffal F, Lakhdar N (2013) An improved analog electrical performance of submicron Dual-Material gate (DM) GaAs-MESFETs using multiobjective computation. J Comput Electron 12(1):29–35
Lv H, Zhang Y, Zhang Y, Yang L-A (2004) Analytic model of IV characteristics of 4H-SiC MESFETs based on multiparameter mobility model. IEEE Trans Electron Devices 51(7):1065–1068
Gaquiere C, Trassaert S, Boudart B, Crosnier Y (2000) High-power GaN MESFET on sapphire substrate. IEEE Microw Guided Wave Lett 10(1):19–20
Hirao T, Onoda S, Oikawa M, Satoh T, Kamiya T, Ohshima T (2009) Transient current mapping obtained from silicon photodiodes using focused ion microbeams with several hundreds of MeV. Nucl Instr Meth B 267:2216–2218
McMorrow D, Knudson AR, Boos JB, Park D, Melinger JS (2004) Ionization-induced carrier transport in InAlAs/InGaAs high electron mobility transistors. IEEE Trans Nucl Sci 51:2857–2864
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The author would like thank the NIT Silchar for providing necessary computational tools.
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Author (Umamaheshwar Soma) studied, calibrated the results for applications and wrote the paper.
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Soma, U. Compression of Gain in n-Channel MESFET for MIMO Applications. Silicon 14, 9669–9673 (2022). https://doi.org/10.1007/s12633-022-01721-8
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DOI: https://doi.org/10.1007/s12633-022-01721-8