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AC Conductivity and Dielectric Behavior of Silicophosphate Glass Doped by Nd2O3

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Abstract

Silicophosphate glasses of nominal composition (P2 O 5 50%-SiO2 30%-Na2O 20%) and Nd2 O 3 additive (0.5 and 2 wt%) were prepared and dielectric behavior has been studied over a temperature range (302–483 K) in the frequency range (0.5 - 3243 kHz). Frequency dependence of AC conductivity (σ ac), has been explored using the universal power law. Disparity of the frequency exponent (s) with temperature was examined in terms of diverse conduction mechanisms. The principal conduction mechanisms were found correlated to both barrier hopping (CBH) and quantum mechanical tunneling (QMT) models. Temperature dependence of σ ac (ω) showed a linear increase with different frequencies. In addition, the capacitance, loss tangent, dielectric loss and dielectric constant were calculated over variable temperature ranges and frequencies.

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Correspondence to A. M. Abdelghany.

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Abdelghany, A.M., Zeyada, H.M., ElBatal, H.A. et al. AC Conductivity and Dielectric Behavior of Silicophosphate Glass Doped by Nd2O3 . Silicon 9, 347–354 (2017). https://doi.org/10.1007/s12633-016-9498-5

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  • DOI: https://doi.org/10.1007/s12633-016-9498-5

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