Abstract
Defected areas purposely made in a standard steel plate of the type used in optical length metrology are investigated by ellipsometric and interferometric methods. The defects range from nano-metric scratches developed by routine work usage to heavy scratches. The optical constants n and k (refractive index and extinction coefficients) of the steel platen measured at different defected areas were obtained by ellipsometry and results were used to deduce the surface roughness of the studied areas. Surface roughness measurement by speckle interferometry based on interference fringes intensities is used to evaluate the ellipsometric measurements of the same defected areas. Results of both measurements allowed us to correlate the optical constants to the roughness degree and revealed that surface defects could be evaluated by ellipsometry. A source of error in the thickness measurement of thin film arising from surface imperfection can then be quantitatively evaluated by ellipsometry. Methods of measurement, analysis, and uncertainties are presented in details.
Similar content being viewed by others
References
F.L. McCrackin, E. Passaglia, R.R. Stromberg, H.L. Steinberg, Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometry. J. Res. Natl. Bureau Stand. A Phys. Chem. 67A, 363–377 (1963)
R.M.A. Azzam, N.M. Bashara, Ellipsometry And Polarized Light (North Holland, Amsterdam, 1977)
N.N. Nagib, N.A. Mahmoud, L.Z. Ismail, M.A. Amer, K. Abd-El-Sabour, Effect of surface roughness on the optical constants of bulk polycrystalline gold samples. Optik 125, 1085–1087 (2014)
S.N. Svitasheva, Random phase mask as model of rough surface. Part I theory. Thin Solid Films 519, 2718–2721 (2011). https://doi.org/10.1016/j.tsf.2010.11.070
M. Losurdo, A.S. Brown, G. Bruno, Graphene and Plasmonics: The Nanoscale Challenges for Real-time Spectroscopic Ellipsometry. E-MRS Fall Meeting, K-X-1: www.european-mrs.com (2012)
N. Farid, H. Hussein, M. Bahrawi, Employing of diode lasers in speckle photography and application of FFT in measurements. MAPAN 30, 125–129 (2015)
M. Nicklawy, A. Fahim, M. Bahrawi, N. Farid, Characterizing surface roughness by speckle pattern analysis. J. Sci. Ind. Res. 68, 118–121 (2009)
I. Ohlidal, F. Luke, K. Navratil, The problem of surface roughness in ellipsometry and reflectometry. J. de Phys. Colloq. 38, 77–88 (1977)
J.R. Blanco, P.J. McMarr, K. Vedam, Roughness measurements by spectroscopic ellipsometry. Appl. Opt. 24(22), 3773–3779 (1985)
S. Lovan, I. Boca, A. Lovan, A computer program for ellipsometric rough surface measurements. Trans. Built Environ., Vol. 12, WIT Press, www.witpress.com, ISSN 1743-3509, pp. 89–94 (1995)
F.S. Cohen, Z. Fan, Rotation and scale invariant texture classification. Proc. IEEE Int. Conf. Robot. Autom. 22(22), 1394–1399 (1988)
B. Ramamoorthy, V. Radhakrishnan, Statistical approaches to surface texture classification. Wear 167, 155–161 (1993)
F. Luk, V. Huynh, W. North, Measurement of surface roughness by machine vision. J. Phys. E Sci. Instrum 22, 977–980 (1989)
M.B. Kiran, B. Ramamoorthy, V. Radhakrishnan, Evaluation of surface roughness by vision system. Int. J. Mach. Tools Manuf 38, 685–690 (1998)
Ulf Persson, Measurement of surface roughness on rough machined surfaces using spectral speckle correlation and image analysis. Wear 160, 221–225 (1993)
B. Dhanasekar, B. Ramamoorthy, Digital speckle interferometry for assessment of surface roughness. Opt. Lasers Eng. 46, 272–280 (2008)
ISO: Guide to the expression of uncertainty in measurements, International standardizations organization publications (1995)
S.V. Kumar, S. Gopa, Surface roughness characterization using interference fringe analysis. Int. J. Innov. Res. Sci. Eng. Technol. 2, 565–574 (2013)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Farid, N., Mahmoud, N. & Nagib, N. Comparative study of a standard optical steel plate surface using ellipsometry and speckle interferometry. J Opt 47, 366–373 (2018). https://doi.org/10.1007/s12596-018-0455-0
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s12596-018-0455-0