Abstract
One of the aspects that semiconductor devices have to cope with in space applications is radiation induced damage. Therefore, radiation hardness studies are crucial for the space missions and a comprehensive on-ground testing of the components needs to be performed aiming at identifying the most radiation tolerant technologies. This paper reports the test results on newly designed and fabricated 8-channel silicon phototransistors arrays, their performance against various layouts designs, and process implementations, and discusses the achieved reliability after exposure to gamma rays, protons radiations, and high-temperature storage at wafer level in the framework of Optoi’s aerospace activities. This work was funded by the European Space Agency. The results also represent a complementary analysis aimed at better understanding and interpreting the outcomes of the non-packaged devices. In conclusion, the best combination of design parameters proving the most robust with respect to the others could be selected, being considered satisfactory and acceptable for the next phase of component assessment.
Similar content being viewed by others
Data availability
The content of this manuscript has not been published already, not even partially.
Code availability
Not applicable.
References
Buchner, S. “Radiation Hardness Assurance (RHA) for Space Systems”, Perot Systems Government Services, Presented by S. Buchner at the 4th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA), West Palm Beach, FL, December, (2008)
Poivey, C. “Radiation hardness assurance (RHA) for space systems,” EPFL Sp. Cent., no. July 2002, pp. 1–58, [Online]. Available: http://radhome.gsfc.nasa.gov/radhome/papers/NSREC02_SC_pres.pdf. (2009) Accessed 1 Oct 2021
Campola, M. J., Pellish, J. A. “Radiation Hardness Assurance : Evolving for NewSpace NASA Electronic Parts Manager / NASA Electronic Parts and Packaging ( NEPP ) Program Deputy Manager,” [Online]. Available: https://ntrs.nasa.gov/api/citations/20200000016/downloads/20200000016.pdf. (2019) Accessed 1 Oct 2021
Bezerra, F. “Radiation test standards for space,” RADSAGA Train. Work., no. March, (2018)
Muschitiello, M., Zadeh, A., Costantino, A. “Irradiation characterization of EEE components for space application,” RADSAGA initial training event, October, (2017)
Weik, M.H.: “Radiation effects on electronics.” Comput. Sci. Commun. Dict. (2000). https://doi.org/10.1007/1-4020-0613-6_15327
Xu, R., et al.: “Degradation of non-linear optocouplers induced by 60 MeV proton irradiation.” Nucl. Instrum. Methods. Phys. Res. Sect. A Accel. Spectrom, Detect. Assoc. Equip. 942, 162383 (2019). https://doi.org/10.1016/j.nima.2019.162383
Irom, F., Edmonds, L.D., Allen, G.R., Rax, B.G.: A method to separate proton damage in LED and phototransistor of optocouplers. IEEE Trans. Nucl. Sci. 65(8), 1553–1560 (2018). https://doi.org/10.1109/TNS.2018.2819960
Irom, F., Allen, G.R., Rax, B.G.: “Measurements of proton displacement damage in several commercial optocouplers.” IEEE Radiat. Eff. Data Work (2016). https://doi.org/10.1109/NSREC.2016.7891723
Sharma, C., Sharma, N., Sharma, P., Kumar, V.: A review of BJT based phototransistor. Int. J. Eng. Res. Technol. 3(4), 306–310 (2014)
Nikolić, D.: “Photodiodes, phototransistors and solar cells behaviour in environment with gamma and neutron radiation: literature review and experiments.” Zb. Rad. Univ. Sinergija 19(4), 90–95 (2019). https://doi.org/10.7251/zrsng1801090n
Irom, F., Allen, G.R., Edmonds, L.D., Rax, B.G.: “Proton damage in LED and phototransistor of micropac 66179 optocoupler.” Proc. Eur. Conf Radiat. Its Eff. Comp Syst. RADECS 2016, 1–7 (2017). https://doi.org/10.1109/RADECS.2016.8093208
Nikolic, D et al. “The impact of successive gamma and neutron irradiation on characteristics of PIN photodiodes and phototransistors.” Radiation effects in materials, July 20, (2016)
Nikolić, D., Stanković, K., Timotijević, L., Rajović, Z., Vujisić, M.: Comparative study of gamma radiation effects on solar cells, photodiodes, and phototransistors. Int. J. Photoenergy. (2013). https://doi.org/10.1155/2013/843174
Vakili, A.E., et al.: “Light Emitting Diodes selection for space applications based on the analysis of proton-induced damage.” 2021 23rd Eur. Microelectron. Packag. Conf. Exhib. (2021). https://doi.org/10.23919/empc53418.2021.9584957
Bregoli, M et al. “Development and ESCC evaluation of a European radiation tolerant optocoupler,” ICSO (2014), October 7–10
Bregoli, M., et al.: “Recent proton and Co60 radiation test data from a newly developed European optocoupler source for space application.” Proc. Eur. Conf. Radiat. Its. Eff. Compon. Syst. RADECS (2013). https://doi.org/10.1109/RADECS.2013.6937401
Bregoli, M et al. “Recent achievements from a new European space optoelectronic component supplier,” ISROS (2014), 16–19 June, Poster session
Bregoli, M., Ceriani, S., Bassetti, D. “Delta-evaluation of a European optocoupler for space applications”, ISROS, 26–29 November, Toulouse, France [Online]. Available: www.optoi.com. (2019) Accessed 1 Oct 2021
Bregoli, M., Bouvier, P., Maglione, A. “Microelectronic packaging assembly and qualification process flows of a customized phototransistor array for aerospace optical encoders,” ISROS, no. April, pp. 28–30, (2010)
Bregoli M et al. “Development and ESCC evaluation of a monolithic silicon phototransistor array for optical encoders”. ICSO, October 7–10. (2014)
Bregoli, M., Ceriani, S., Erspan, M., Collini, A., Ficorella, F., How, L. S. “Manufacturing and preliminary space assessment of a European source of 8-channel silicon photodiodes for optical encoders.” ISROS, June 6–9, Otwock, Poland (2016)
Ceriani, S., Bregoli, M. “Development and ESCC approval of a European source of 8-channel silicon phototransistors for optical encoders”, ESA study contract and radiation report, ESTEC contract No.4000104712/11/NL/RA, contractor : Optoelettronica italia srl contractor, volume no.24.A, (2014)
Acknowledgements
This work has been supervised by European Space Agency. The Technical Officer appointed for this activity is Dr Charlotte Bringer of ESA. Furthermore, the kind supports of Dr Christian Poivey (from ESA), Prof. Antonino LaMagna (from CNR-IMM), Prof. Vincenzo Bellini (from INFN-Catania), and Prof. David Mascali (from INFN-LNS) are acknowledged.
Funding
The research leading to these results received funds from the GSTP funding scheme (General Support Technology Programme) of the European Space Agency through the national support of Italy. The Contractor is Optoi (ESTEC Contract No: 4000127011/19/NL/FE/hh).
Author information
Authors and Affiliations
Contributions
All authors contributed to the study conception and design. Material preparation, data collection, and analysis were performed by FF, SC, DB, MB, AEV, and CB. The interpretation of results was performed by FF, LP, MB, CB, SC, and AEV.
Corresponding author
Ethics declarations
Conflict of interest
Not applicable.
Informed consent
All authors consented to the submission of this manuscript.
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Supplementary Information
Below is the link to the electronic supplementary material.
Rights and permissions
About this article
Cite this article
Eshkevar Vakili, A., Bregoli, M., Ceriani, S. et al. Selection of 8-channel silicon phototransistor arrays for space applications, based on wafer-level radiation and high-temperature storage tests. CEAS Space J 14, 263–285 (2022). https://doi.org/10.1007/s12567-022-00443-2
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s12567-022-00443-2