Abstract
In an atomic force microscope, a microcantilever is used as a sensor to measure various characteristics of the specimen through interaction. In this paper, we propose a 3D-printable microcantilever holder to increase the ease of attachment and detachment of microcantilevers and to enable users to choose from various microcantilevers for atomic force microscopes using a mounted cantilever, or to design and build do-it-yourself atomic force microscopes. In our experiments, we applied the fabricated microcantilever holder to a commercial atomic force microscope, and stable images were obtained by the contact and tapping modes.
References
Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930–933.
Lee, J., Song, J., Kim, S., Kim, S., Lee, W., Jackman, J., Kim, D., Cho, N., & Lee, J. (2016). Multifunctional hydrogel nano-probes for atomic force microscopy. Nature Communication, 7, 11566.
Lee, S. H. (2018). Low cost platform for scanning probe microscope. In Proceedings of the International Scanning Probe Microscopy, Arizona.
Lee, S. H. (2019). A cost-effective atomic force microscope. In Proceedings of the Korean Physical Society fall meeting, p.471.
Lee, S. H. (2020). J3SPM: An open-source microcontroller-powered control system for atomic force microscope. International Journal of Precision and Manufacturing Engineering, 21, 1755–1762.
Akrami, S. M. R., Miyata, K., Asakawa, H., & Fukuma, T. (2014). Note: High-speed Z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid. Review of Scientific Instruments, 85, 126106.
Fukuda, S., Uchihashi, T., & Ando, T. (2015). Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope. Review of Scientific Instruments, 86, 063703.
Carrasco, C., Ares, P., De Pablo, P. J., & Gómez-Herrero, J. (2008). Cutting down the forest of peaks in acoustic dynamic atomic force microscopy in liquid. Review of Scientific Instruments, 79, 126106.
Adams, J. D., York, D., & Whisman, N. (2004). Reduction of spurious resonance peaks in microcantilever tuning through substrate contact surface reduction. Review of Scientific Instruments, 75, 9.
Acknowledgements
This research was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (NRF-2018R1D1A1B07044997).
Author information
Authors and Affiliations
Corresponding author
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Lee, S. A 3D-printed Microcantilever Holder for Atomic Force Microscopes Using a Mounted Microcantilever. Int. J. Precis. Eng. Manuf. 24, 303–307 (2023). https://doi.org/10.1007/s12541-022-00739-7
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s12541-022-00739-7