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Development of a SCAR marker by inter-simple sequence repeat for diagnosis of dwarf bunt of wheat and detection of Tilletia controversa Kühn

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Abstract

Dwarf bunt of wheat, caused by Tilletia controversa Kühn, is a destructive disease on wheat as well as an important internationally quarantined disease in many countries. The primer ISSR818 generated a polymorphic pattern displaying a 867-bp DNA fragment specific for T. controversa. The marker was converted into a sequence characterized amplified region (SCAR), and specific primers (TCKSF3/TCKSR3) designed for use in PCR detection assays; they amplified a unique DNA fragment in all isolates of T. controversa but not in the related pathogens. The detection limit with the primer set (TCKSF3/TCKSR3) was 5 ng of DNA which could be obtained from 5.5 μg of teliospores in a 25-μL PCR reaction mixture.

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Abbreviations

AFLP:

amplified fragment length polymorphism

CAPS:

cleavage amplified polymorphic sequence

ISSR:

inter-simple sequence repeat

ITS:

internal transcribed spacer

PCR:

polymerase chain reaction

RAPD:

random amplification of polymorphic DNA

RFLP:

restriction fragment length polymorphism

SCAR:

sequence characterized amplified region

SSR:

simple sequence repeat

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Authors and Affiliations

  1. State Key Laboratory for Biology of Plant Diseases and Insect Pests, Institute of Plant Protection, CAAS, Beijing, 100193, P.R. China

    L. Gao, W. Q. Chen & T. G. Liu

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  1. L. Gao
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  2. W. Q. Chen
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  3. T. G. Liu
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Correspondence to W. Q. Chen.

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Gao, L., Chen, W.Q. & Liu, T.G. Development of a SCAR marker by inter-simple sequence repeat for diagnosis of dwarf bunt of wheat and detection of Tilletia controversa Kühn . Folia Microbiol 55, 258–264 (2010). https://doi.org/10.1007/s12223-010-0038-1

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  • DOI: https://doi.org/10.1007/s12223-010-0038-1

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