Comparison analysis of efficiency between double-synchronous step-down-stress and step-up-stress accelerated life tests

  • Haixia Kou (寇海霞)
  • Zongwen An (安宗文)
  • Daoming Sun (孙道明)
Article
  • 21 Downloads

Abstract

Double-crossed-step-stress (DCSS) accelerated life test (ALT) method is widely used for estimating the lifetime of products with high reliability and long lifetime. In order to further reduce the test time and test cost, a double-synchronous-step-stress (DSSS) ALT method which combines a double-synchronous-step-down-stress (DSSDS) ALT method and a double-synchronous-step-up-stress (DSSUS) ALT method is proposed. The accelerated stresses decrease and increase in a synchronous way with one step in the DSSDS-ALT and DSSUS-ALT methods, respectively. Monte Carlo method is adopted to simulate the two methods, and the validity and efficiency of them are demonstrated by the simulation results. In addition, a comparison analysis of efficiency between DSSDS-ALT method and DSSUS-ALT method is carried out. The result shows that the DSSDS-ALT method compared with the DSSUS-ALT method can significantly improve the test efficiency under the same test condition.

Keywords

accelerated life test (ALT) double-synchronous-step-down-stress (DSSDS) double-synchronousstep- up-stress (DSSUS) efficiency Monte Carlo 

CLC number

TP 391.9 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. [1]
    CHEN W H, LIU J, GAO L, et al. Step-stress accelerated degradation test modeling and statistical analysis methods [J]. Chinese Journal of Mechanical Engineering, 2013, 26(6): 1154–1159.CrossRefGoogle Scholar
  2. [2]
    NELSONW. Accelerated life testing: Step-stress models and data analysis [J]. IEEE Transactions on Reliability, 1980, R-29(2): 103–108.CrossRefGoogle Scholar
  3. [3]
    MEEKER W Q, ESCOBAR L A. Statistical methods for reliability data [M]. New York: Wiley, 1998.MATHGoogle Scholar
  4. [4]
    ESCOBAR L A, MEEKER W Q. A review of accelerated test models [J]. Statistical Science, 2006, 21(4): 552–577.MathSciNetCrossRefMATHGoogle Scholar
  5. [5]
    BAGDONAVICIUS V, NIKULIN M. Accelerated life models: Modeling and statistical analysis [M]. New York: Chapman & Hall, 2002.MATHGoogle Scholar
  6. [6]
    ZHANG C H, CHEN X, WEN X S. Step-down-stress accelerated life testing: Methodology [J]. Acta Armamentarii, 2005, 26(5): 661–665 (in Chinese).Google Scholar
  7. [7]
    XU X L, WANG R H, YU S, et al. Comparison analysis of efficiencies for lognormal distribution based on step acceleration test and step deceleration test [J]. Journal of Mechanical Engineering, 2009, 45(4): 56–63 (in Chinese).CrossRefGoogle Scholar
  8. [8]
    JIA Z Q, LIANG Y Y. New research about doublestress accelerated life testing-methodology [J]. Journal of Ordnance Engineering College, 2007, 19(3): 9–12 (in Chinese).Google Scholar
  9. [9]
    CHEN J, WANG D Y, FU Y L, et al. Doublecrossed step-stress accelerated life testing for pneumatic cylinder [J]. Applied Mechanics and Materials, 2011, 121/122/123/124/125/126: 1274–1278.CrossRefGoogle Scholar
  10. [10]
    CHEN J, LI J, WANG D Y, et al. Double-crossed step-down-stress accelerated life testing for pneumatic cylinder based on cumulative damage model [J]. Advanced Materials Research, 2014, 871: 56–63.CrossRefGoogle Scholar
  11. [11]
    LI K. Statistical analysis of censoring data from alternate stepwise stress accelerated life testing method under two-parameter exponential distribution [D]. Nanjing: College of Sciences, Nanjing Agriculture University, 2008 (in Chinese).Google Scholar
  12. [12]
    Lü M, CAI J Y, PAN G, et al. Optimal design of double-crossed step-down-stress accelerated life test based on Monte Carlo simulation [J]. Electronics Optics & Control, 2013, 20(10): 96–101 (in Chinese).Google Scholar
  13. [13]
    SUN Y D, SHI Y M. Numerical simulation of doublecrossed step-down-stress accelerated life test under lognormal distribution [J]. Fire Control & Command Control, 2012, 37(9): 23–26 (in Chinese).Google Scholar

Copyright information

© Shanghai Jiaotong University and Springer-Verlag Berlin Heidelberg 2017

Authors and Affiliations

  • Haixia Kou (寇海霞)
    • 1
  • Zongwen An (安宗文)
    • 1
  • Daoming Sun (孙道明)
    • 1
  1. 1.School of Mechatronics EngineeringLanzhou University of TechnologyLanzhouChina

Personalised recommendations