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Reliability analysis for the competing failure with probabilistic failure threshold value and its application to the k-out-of-n systems

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Abstract

A method for reliability analysis of the competing failure with the probabilistic failure threshold value not the fixed threshold value is presented, which involves the random shocks and the degradation is independent and dependent respectively. Specifically, for the dependent condition, the effect due to the random shocks on the degradation is considered with a damage factor. In addition, the dependent competing failure model is applied to the reliability analysis of the k-out-of-n systems. Finally, two studied cases are presented to illustrate the proposed method, and the results show the proposed method is reasonable.

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References

  1. Alessandro B. Reliability engineering: Theory and practice [M]. New York USA: Springer, 2010.

    Google Scholar 

  2. Jiang L, Feng Q M, Coit D W. Reliability and maintenance modeling for dependent competing failure processes with shifting failure thresholds [J]. IEEE Transactions on Reliability, 2012, 61(4): 932–948.

    Article  Google Scholar 

  3. Klutke G A, Yang Y J. The availability of inspected systems subject to shocks and graceful degradation [J]. IEEE Transactions on Reliability, 2002, 51(3): 371–374.

    Article  Google Scholar 

  4. Wang Y P, Pham H. Modeling the dependent competing risks with multiple degradation processes and random shock using time-varying copulas [J]. IEEE Transactions on Reliability, 2012, 61(1): 13–22.

    Article  Google Scholar 

  5. Li W J, Pham H. Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks [J]. IEEE Transactions on Reliability, 2005, 54 (2): 297–303.

    Article  Google Scholar 

  6. Huang W, Askin R G. Reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation [J]. Quality and Reliability Engineering International, 2003, 19: 241–254.

    Article  Google Scholar 

  7. Peng H, Feng Q, Coit D W. Reliability and maintenance modeling for systems subject to multiple dependent competing failure processes [J]. IIE Transactions, 2011, 43: 12–22.

    Article  Google Scholar 

  8. Chen J Y, Li Z H. An extended extreme shock maintenance model for a deteriorating system [J]. Reliability Engineering and System Safety, 2008, 93: 1123–1129.

    Article  Google Scholar 

  9. Mallor F, Santos J. Reliability of systems subject to shocks with a stochastic dependence for the damages [J]. Test, 2003, 12(2): 427–444.

    Article  MathSciNet  MATH  Google Scholar 

  10. Li Z H, Zhao P. Reliability analysis on the d-shock model of complex systems [J]. IEEE Transactions on Reliability, 2007, 56(2): 340–348.

    Article  Google Scholar 

  11. Sgarbossa F, Pham H. A cost analysis of systems subject to random field environments and reliability [J]. IEEE Transactions on Systems, Man, and Cybernetics. Part C. Application and Reviews, 2010, 40(4): 429–437.

    Article  Google Scholar 

  12. Nakagawa T. Shock and damage models in reliability theory [M]. London UK: Springer, 2007.

    MATH  Google Scholar 

  13. Robinson M E, Crowder M J. Bayesian methods for a growth-curve degradation model with repeated measures [J]. Lifetime Data Analysis, 2000, 6: 357–374.

    Article  MathSciNet  MATH  Google Scholar 

  14. Yuan X X, Pandey M D. A nonlinear mixed-effects model for degradation data obtained from in-service inspections [J]. Reliability Engineering and System Safety, 2009, 94: 509–519.

    Article  Google Scholar 

  15. Nicolai R P, Dekker R, van Noortwijk J M. A comparison of models for measurable deterioration: An application to coatings on steel structures [J]. Reliability Engineering and System Safety, 2007, 92: 1635–1650.

    Article  Google Scholar 

  16. Xue J, Yang K. Dynamic reliability analysis of coherent multistate systems [J]. IEEE Transactions on Reliability, 1995, 44(4): 683–688.

    Article  Google Scholar 

  17. Huang W, Dietrich D L. An alternative degradation reliability modeling approach using maximum likelihood estimation [J]. IEEE Transactions on Reliability, 2005, 54(2): 310–317.

    Article  Google Scholar 

  18. Lu C J, Meeker W Q. Using degradation measures to estimate a time-to-failure distribution [J]. Technometrics, 1993, 35(2): 161–174.

    Article  MathSciNet  MATH  Google Scholar 

  19. Pham H. On the optimal design of k-out-of-n subsystems [J]. IEEE Transactions on Reliability, 1992, 41(4): 572–574.

    Article  MATH  Google Scholar 

  20. Pham H, Wang H. Optimal (t, T) opportunistic maintenance of a k-out-of-n: G system with imperfect PM and partial failure [J]. Naval Research Logistics, 2000, 47: 223–239.

    Article  MathSciNet  MATH  Google Scholar 

  21. Liu Y, Huang H Z, Pham H. Reliability evaluation of systems with degradation and random shocks [C]// Proceedings of the Reliability and Maintainability Symposium. Las Vegas USA: IEEE, 2008: 328–333.

    Google Scholar 

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Correspondence to Hai-qing Li  (李海庆).

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Foundation item: the Special Research Fund for the National Natural Science Foundation of China (No. 11272082), the Fundamental Research Funds for the Central Universities (No. E022050205) and the Open Research Fund of Key Laboratory of Fluid and Power Machinery of Xihua University (No. szjj2013-03)

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Yuan, R., Li, Hq., He, Lp. et al. Reliability analysis for the competing failure with probabilistic failure threshold value and its application to the k-out-of-n systems. J. Shanghai Jiaotong Univ. (Sci.) 20, 500–507 (2015). https://doi.org/10.1007/s12204-015-1657-0

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  • DOI: https://doi.org/10.1007/s12204-015-1657-0

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