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Power spectral density measurement for large aspheric surfaces

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Abstract

To ensure the safe and normal operation of the whole optical system, it is important to test and evaluate the quality of optical components. The article explores the advantages and disadvantages of general parameters used in aspheric surface testing, the composition of the system, the principle of operation and the design of related power spectral density (PSD) software used in testing large aspheric surfaces with Shack-Hartmann and phase shifting interferometer. The results indicate that PSD can give the spatial frequency distribution of the wavefront aberration when large aperture phase shifting interferometer is used as an instrument to test the wavefront, and this can also be applied as an evaluation standard in testing the quality of optical components. In addition, this paper describes the test results of optical components in the size of 64 mm × 64 mm.

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Authors and Affiliations

  1. Xi’an University of Science and Technology, Xi’an, 710054, China

    Wei Chen

  2. Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, 610209, China

    Hanmin Yao, Fan Wu, Shibin Wu & Qiang Chen

Authors
  1. Wei Chen
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  2. Hanmin Yao
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  3. Fan Wu
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  4. Shibin Wu
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  5. Qiang Chen
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Corresponding author

Correspondence to Wei Chen.

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Translated from Opto-Electronic Engineering, 2006, 33(3): 20–23 [译自: 光电工程]

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Chen, W., Yao, H., Wu, F. et al. Power spectral density measurement for large aspheric surfaces. Front. Optoelectron. China 1, 197–200 (2008). https://doi.org/10.1007/s12200-008-0032-2

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  • DOI: https://doi.org/10.1007/s12200-008-0032-2

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