Skip to main content
Log in

RETRACTED ARTICLE: Model for estimating power dissipation along the interconnect length in single on-chip topology

  • Special Issue
  • Published:
Evolutionary Intelligence Aims and scope Submit manuscript

This article was retracted on 10 July 2023

This article has been updated

Abstract

Designing a typical microcircuit for multi-core chips includes the development of the overall system architecture as well as the creation of single-chip multiprocessor systems, which house a set of interrelated nodes. To evaluate the complexity and power consumption of these multiprocessor systems, adequate models and methods are required. A simplified model for calculating heat dissipation in conductors suits this purpose completely. The preliminary settlement of the heat dissipation parameter will allow engineers to evaluate the on-chip interconnect topology at the early stages of design so that these interconnects comply with the power dissipation and the power consumption variables. The novelty of this approach lies in the fact that it allows modeling thermal stresses that take place inside the chip. A solver applied here enables numerical solution to differential equations that is theoretically best, i.e., a direct numerical solution. In addition, it overcame the Gibbs phenomenon by incorporating more natural, not sharp boundary conditions into the model. Here, this approach was applied to the multiprocessor system design that implies the integration of processor cores in a single chip package.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1
Fig. 2

Similar content being viewed by others

Change history

References

  1. Garimella SV, Fleischer AS, Murthy JY et al (2008) Thermal challenges in next-generation electronic systems. IEEE Trans Compon Packag Technol 31(4):801–815

    Article  Google Scholar 

  2. Osonoe K, Aoki M, Mochizuki A et al (2017) Thermal stress analysis under thermal cycling test for SiC power device heat dissipation structures using Ag sintered layer. In: 2017 international conference on electronics packaging (ICEP). IEEE, pp 544–548

  3. Ghimire P (2015) Real time monitoring and wear out of power modules. Department of Energy Technology, Aalborg University

  4. Asai T, Aoki M, Mochizuki A et al (2015) Stress and strain analysis using multi-physics solver for power device heat dissipation structures under thermal cycling test. In: 2015 international conference on electronics packaging and iMAPS all Asia conference (ICEP-IAAC). IEEE, pp 818–821

  5. Zhou B, Qi X (2011) Static thermal resistance test and simulation analysis technology for hybrid microcircuit. In 2011 international symposium on advanced packaging materials (APM). IEEE, pp 394–398

  6. Morrison M, Hastings C, Mischo K (2015) Hands-on start to wolfram mathematica. IWU Authors Bookshelf

  7. Xu JZ, Gao BZ, Kang FY (2016) A reconstruction of Maxwell model for effective thermal conductivity of composite materials. Appl Therm Eng 102:972–979

    Article  Google Scholar 

  8. Fihtengoltz GM (1966) The course of differential and integral calculus. Nauka Publishing House, Moscow

    Google Scholar 

  9. Gibanov NS, Sheremet M (2018) Numerical simulation of convective-radiative heat transfer in a square cavity having local triangular heat-generating source. In ICTEA: international conference on thermal engineering

  10. Chang X, Ma Z, Yang Y et al (2016) Bi-level semantic representation analysis for multimedia event detection. IEEE Trans Cybern 47:1180–1197

    Article  Google Scholar 

  11. Bulat MP, Bulat PV (2013) The history of the gas bearings theory development. World Appl Sci J 27:893–897

    Google Scholar 

  12. Park SJ, Jang D, Yook SJ et al (2015) Optimization of a staggered pin-fin for a radial heat sink under free convection. Int J Heat Mass Transf 87:184–188

    Article  Google Scholar 

  13. Li Z, Nie F, Chang X, Yang Y (2017) Beyond trace ratio: weighted harmonic mean of trace ratios for multiclass discriminant analysis. IEEE Trans Knowl Data Eng 29:2100–2110

    Article  Google Scholar 

  14. Wang Y, Cen J, Jiang F et al (2017) Heat dissipation of high-power light emitting diode chip on board by a novel flat plate heat pipe. Appl Therm Eng 123:19–28

    Article  Google Scholar 

  15. Zaretabar M, Asadian H, Ganji DD (2018) Numerical simulation of heat sink cooling in the mainboard chip of a computer with temperature dependent thermal conductivity. Appl Therm Eng 130:1450–1459

    Article  Google Scholar 

  16. Altman DH, Gupta A, Tyhach M (2015) Development of a diamond microfluidics-based intra-chip cooling technology for GaN. In ASME 2015 international technical conference and exhibition on packaging and integration of electronic and photonic microsystems collocated with the ASME 2015 13th international conference on nanochannels, microchannels, and minichannels, American Society of Mechanical Engineers Digital Collection

  17. Tapaninen O, Myöhänen P, Majanen M et al (2016) Optical and thermal simulation chain for LED package. In 2016 17th international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (EuroSimE). IEEE, pp 1–6

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Alexey Mikhaylov.

Additional information

Publisher's Note

Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations

This article has been retracted. Please see the retraction notice for more detail: https://doi.org/10.1007/s12065-023-00865-9"

Rights and permissions

Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Gura, D., Mikhaylov, A., Glushkov, S. et al. RETRACTED ARTICLE: Model for estimating power dissipation along the interconnect length in single on-chip topology. Evol. Intel. 15, 2369–2373 (2022). https://doi.org/10.1007/s12065-020-00407-7

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s12065-020-00407-7

Keywords

Navigation