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Measurement of copper vapour laser-induced deformation of dielectric-coated mirror surface by Michelson interferometer

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An Erratum to this article was published on 22 May 2014

Abstract

A Michelson interferometer-based technique has been used to measure the deformation of dielectric-coated mirror, caused by an incident repetitive pulsed laser beam with high average power. Minimum measurable deformation of 17 nm is reported.

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Acknowledgement

The authors thank Ch S Rao, V R Patil and T B Pal for their help with the equipment and useful discussions.

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Authors and Affiliations

  1. Laser & Plasma Technology Division, Beam Technology Development Group, Bhabha Atomic Research Centre, Mumbai, 400 085, India

    A WAHID, S KUNDU, J S B SINGH, A K SINGH, A KHATTAR, S K MAURYA, J S DHUMAL & K DASGUPTA

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  1. A WAHID
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  2. S KUNDU
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  3. J S B SINGH
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  4. A K SINGH
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  5. A KHATTAR
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  6. S K MAURYA
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  7. J S DHUMAL
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  8. K DASGUPTA
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Correspondence to A WAHID.

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WAHID, A., KUNDU, S., SINGH, J.S.B. et al. Measurement of copper vapour laser-induced deformation of dielectric-coated mirror surface by Michelson interferometer. Pramana - J Phys 82, 445–449 (2014). https://doi.org/10.1007/s12043-014-0704-y

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  • DOI: https://doi.org/10.1007/s12043-014-0704-y

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