Abstract
Grazing incidence neutron reflectometry provides an opportunity to measure the depth profile of a thin film sample with a resolution <1 nm, in a non-destructive way. In this way the diffusion across the interfaces can also be measured. In addition, neutrons have contrast among the isotopes, making it feasible to measure the self-diffusion. In the present work, the isotope multilayers of [FeN/57FeN]10 and [FeN/Fe15N]10 were prepared using magnetron sputtering and self-diffusion of Fe and N was investigated. It was found that N diffusion is slower compared to Fe and does not follow the atomic size dependence.
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Gupta, M., Gupta, A., Wildes, A. et al. Fe and N diffusion in nitrogen-rich FeN measured using neutron reflectometry. Pramana - J Phys 71, 1085–1089 (2008). https://doi.org/10.1007/s12043-008-0228-4
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DOI: https://doi.org/10.1007/s12043-008-0228-4