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Phase stabilization in cinnarizine complexes using X-ray profile analysis

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Abstract

Characterization of cobalt(II), cadmium(II), copper(II) and tin(II) cinnarizine complexes have been carried out using conductivity, electronic spectra, infrared, nmr, thermogravimetric and X-ray analyses to establish the nature of phase stabilization in these materials. Also, the intrinsic strain components present in these materials during the formation have been computed using wide-angle X-ray scattering analysis. The variation of the crystallite shape ellipsoid in these materials has been discussed on the basis of Hosemann’s paracrystalline model.

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Authors and Affiliations

  1. Department of Studies in Chemistry, University of Mysore, 570 006, Mysore, India

    G Nagendrappa, S Subramanya Raj Urs, M S Madhava & R Somashekar

  2. Department of Studies in Physics, University of Mysore, 570 006, Mysore, India

    M S Madhava & R Somashekar

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  1. G Nagendrappa
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  2. S Subramanya Raj Urs
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  3. M S Madhava
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  4. R Somashekar
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Nagendrappa, G., Subramanya Raj Urs, S., Madhava, M.S. et al. Phase stabilization in cinnarizine complexes using X-ray profile analysis. Pramana - J Phys 56, 797–808 (2001). https://doi.org/10.1007/s12043-001-0080-2

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  • DOI: https://doi.org/10.1007/s12043-001-0080-2

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