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Study of influence on micro-fabricated resistive switching organic ZrO2 array by C-AFM measurement

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Abstract

In this paper, a comparison of the interfacial electronic properties between Pt/Ir conductive atomic force microscopy (C-AFM) tip and ZrO2 organic array was carried out. A uniformed ZrO2 array was fabricated with a mean diameter of around 1 μm using laser interference lithography. A C-AFM measurement set-up was built up. The I–V curve was directly measured of the organic ZrO2 array which shows a resistive switching characteristic by C-AFM measurement. The set voltage is 18.0 V and the reset voltage is −5.0 V. After the Pt layer was coated on the ZrO2 array, the set voltage decreases to 0.8 V and the reset voltage decreases to −2.2 V. This result shows that Pt layer can prevent the potential drop effectively. The electron barrier height between Pt/Ir C-AFM tip and organic ZrO2 array was enhanced by sputtering Pt layer on the ZrO2 organic array.

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References

  1. Horowitz G 1998 Adv. Mater. 10 365

  2. Oyamada T, Tanaka H, Matsushige K, Sasabe H and Adachi C 2003 Appl. Phys. Lett. 83 1252

  3. Biju K P, Liu X, Kim J, Jung S, Lee J and Hwang H 2011 Curr. Appl. Phys. 11 S102

  4. Li Y and Long S 2010 IEEE Electron. Device Lett. 31 117

  5. Peng S, Fei Z, Chen X, Zhu X and Li R 2011 Appl. Phys. Lett. 100 072101

  6. Tiedke S and Schmitz T 2001 Appl. Phys. Lett. 79 3678

  7. Wojtyniak M, Szot K and Waser R 2011 Appl. Surf. Sci. 257 7627

  8. Yang L, Kuegeler C, Szot K, Ruediger A and Waser R 2009 Appl. Phys. Lett. 95 013109

  9. Wang Z and Zhao G 2008 Sci. China Ser. E-Technol. Sci. 51 1995

  10. Wang Z and Zhao G 2011 J. Non-Cryst. Solids 357 1223

  11. Peter F, Szot K, Waser R, Reichenberg B, Tiedke S and Szade J 2004 Appl. Phys. Lett. 85 2896

  12. Peter F, Kubacki J, Szot K, Reichenberg B and Waser R 2006 Phys. Status Solidi A 203 616

  13. Awais M N, Muhammad N M, Navaneethan D, Kim H C, Jo J and Choi K H 2013 Microelectron. Eng. 103 167

  14. Su W S, Chena Y F, Hsiao C L and Tu L W 2007 Appl. Phys. Lett. 90 063110

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Acknowledgements

This work was supported by the National Natural Science Foundation of China (No. 51372198). We thank the Foundation of young teachers of Xian University of Technology. We also thank the National Natural Science Foundation of China (No. 51202190).

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Authors and Affiliations

  1. Advanced Material Analysis Center, Xi’an University of Technology, Xi’an, Shaanxi, 710048, China

    YING LI

  2. Material Science and Engineering School, Xi’an University of Technology, Xi’an, Shaanxi, 710048, China

    GAOYANG ZHAO, LONG JIN & YAJING WANG

  3. Northwest Electric Power Design Institute of China Power Engineering Consulting Group, Xi’an, Shaanxi, 710075, China

    ZHIBO KOU

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  1. YING LI
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  2. GAOYANG ZHAO
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  3. ZHIBO KOU
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  4. LONG JIN
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Correspondence to YING LI.

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LI, Y., ZHAO, G., KOU, Z. et al. Study of influence on micro-fabricated resistive switching organic ZrO2 array by C-AFM measurement. Bull Mater Sci 38, 1055–1059 (2015). https://doi.org/10.1007/s12034-015-0932-x

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