Abstract
We predict that there is a critical value of Al2O3/ZnO nano thin interface thickness based on two assumptions according to an interesting phenomenon, which the thermal conductivity (TC) trend of Al2O3/ZnO nano thin interface is consistent with that of relevant single nano thin interface when the nano thin interface thickness is > 300 nm; however, TC of Al2O3/ZnO nano thin interface is higher than that of relevant single nano thin interface when the thin films thickness is < 10 nm. This prediction may build a basis for the understanding of interface between two different oxide materials. It implies an idea for new generation of semiconductor devices manufacturing.
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References
Abramson, A.R., C.L. Tien, and A. Majumdar. 2002. J. Heat Transf. 124: 963.
Bai, S.Y., Z.A. Tang, Z.X. Huang, J. Yu, and J.Q. Wang. 2008. Chinese Phys Lett. 25: 593.
Bai, S.Y., Z.A. Tang, Z.X. Huang, and J. Yu. 2009. IEEE Trans Ind. Electron. 56: 3238.
Che, J., T. Cagin, and W.A. Goddard III. 2000. Nanotechnology 11: 65.
Chen, G., and P. Hui. 1999. Thin Solid Films 339: 58.
Cheng, A., P. Sidauruk, and Y. Abousleiman. 1994. Mathematica J. 4: 76.
Chiritescu, C., D.G. Cahill, N. Nguyen, D. Johnson, A. Bodapati, P. Keblinski, and P. Zschack. 2007. Science 315: 351.
Choi, S.R., D. Kim, S.H. Choa, S.H. Lee, and J.K. Kim. 2006. Int. J. Thermophys. 27: 896.
Costescu, R.M., D.G. Cahill, F.H. Fabreguette, Z.A. Sechrist, and S.M. George. 2004. Science 303: 989.
Fan, H.J., et al. 2006. Small 2: 561.
Flik, M.I., B.I. Choi, and K.E. Goodson. 1992. J. Heat Transfer 114: 666.
Glässl, M., M. Hilt, and W. Zimmermann. 2011. Phys. Rev. E83: 046315.
Huang, Z.X., Z.A. Tang, J. Yu, and S.Y. Bai. 2011. Physica B406: 818.
Hui, P., and H.S. Tan. 1994. IEEE Trans. Compon. Packag. Manuf. Technol. Part B 17: 426.
Jin, B.J., S.H. Bae, S.Y. Lee, and S. Im. 2000. Mater. Sci. Eng. B71: 301.
Keppler, H., L.S. Dubrovinsky, O. Narygina, and I. Kantor. 2008. Science 322: 1529.
Kim, T.H., et al. 2011. Appl. Phys. Lett. 98: 022904.
Li, D.Y., Y.Y. Wu, P. Kim, L. Shi, P.D. Yang, and A. Majumdar. 2003. Appl. Phys. Lett. 83: 2934.
Li, Y.P., and G.P. Zhang. 2010. Acta Mater. 58: 3877.
Liao, N.B., P. Yang, M. Zhang, and W. Xue. 2010. Mater. Sci. Eng. A527: 6076.
Liu, X.G., X.M. Wang, W.P. Ke, W. Tao, X. Zhao, and X.F. Sun. 2011. Phys. Rev. B83: 144408.
Lukes, J.R., D.Y. Li, X.G. Liang, and C.L. Tien. 2000. J. Heat Transf. 122: 536.
Murshed, S.M.S., K.C. Leong, and C. Yang. 2008. Int. J. Therm. Sci. 47: 560.
Olsson, M.K., K. Macak, and W. Graf. 1999. Surf. Coat. Technol. 122: 202.
Xu, F., Q.Q. Qin, A. Mishra, Y. Gu, and Y. Zhu. 2010. Nano Res. 3: 271.
Yang, P., and N.B. Liao. 2008. IEEE Trans. Adv. Packaging 31: 496.
Yang, P., Y.S. Wu, H.F. Xu, X.X. Xu, L.Q. Zhang, and P. Li. 2011. Acta. Phys. Sin. 60: 066601.
Yang, P., H.F. Xu, L.Q. Zhang, F.W. Xie, and J.M. Yang. 2012. ACS Appl Mat. Interf. 4: 158.
Zeng, T.F., and G. Chen. 2001. J. Heat Transfer 123: 340.
Zhao, Y.M., G. Chen, S.Z. Wang, and S.F. Yoon. 2004. Thin Solid Films 450: 352.
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Yang, P., Zhang, L., Yang, H. et al. Experiment and Prediction on Thermal Conductivity of Al2O3/ZnO Nano Thin Film Interface Structure. Bull Mater Sci 37, 449–454 (2014). https://doi.org/10.1007/s12034-014-0667-0
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DOI: https://doi.org/10.1007/s12034-014-0667-0