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Ion Beam Analysis of Proton-Induced X-ray Emission (PIXE) Techniques for Elemental Investigation of Young Stage Neem Leaf of Southern India, Tamil Nadu

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A Correction to this article was published on 10 February 2021

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Abstract

Young stage neem leaf (Azadirachta indica) was collected at Thiruvallur district in Tamil Nadu, South India. Multi-elemental analysis of neem leaf was carried out using non-destructive techniques (NDT) of proton-induced X-ray emission (PIXE, 2.5 MeV) which is one of the well-known surface chemical sophisticated analytical methods of ion beam analyses (IBA). From the emitted X-ray output of the target specimen specimen fingerprint multi-elements such as, aluminium (Al), silicon (Si), phosphorus (P), sulphur (S), chloride (Cl), potassium (K), calcium (Ca), titanium (Ti), manganese (Mn), iron (Fe), copper (Cu), zinc (Zn) and strontium (Sr) are found to be present in the leaf in different ppm levels. Among the elements, silicon (Si, 42034 + 1198.0 ppm) and potassium (K, 28985 + 747.8 ppm) showed the highest concentration. Minor elements (Mn, Sr, Fe, Zn, Cu and Ti) are observed in the neem plant. The variation in elemental concentration in the leaf may be due to soil, water, etc. However, there are no toxic elements observed like arsenic and lead in the leaf. Further, though the presence of different medicinal values in the target specimen chemical multi-elements observed in ppm level. However, there are more chemical analysis to be required for the functionalization of active biomedical applications for these kinds of medicinal species.

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Acknowledgements

The authors would like to thank Dr. Sri Nisha, Chairman, Central Research Laboratory (CRL), Sree Balaji Medical College and Hospital (SBMCH), BIST, Chennai, and respected Dr. S. Jagathrakshakan, Ex. Minister of State, Commerce and Industry, Government of India. Further, we also thank the National Isotope Centre, GNS Science, New Zealand, for the facilities to carry out IBA Techniques of PIXE analysis and iThemba LABS, South Africa.

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Authors and Affiliations

  1. Central Research Laboratory, Sree Balaji Medical College and Hospital (SBMCH), Bharath Institute of Science and Technology (BIST), Chromepet, Chennai, Tamil Nadu, 600044, India

    Manikandan Elayaperumal, Yaminipriya Vedachalam & Dhanasekar Loganathan

  2. Nanosciences African Network (NANOAFNET), iThemba LABS-National Research Foundation, 1 Old Faure Road, Somerset West 7129, P.O. Box 722, Somerset West, Western Cape Province, South Africa

    Manikandan Elayaperumal & John Kennedy

  3. UNESCO-UNISA Africa Chair in Nanosciences/Nanotechnology, College of Graduate Studies, University of South Africa, Muckleneuk Ridge, P.O. Box 392, Pretoria, South Africa

    Manikandan Elayaperumal & John Kennedy

  4. Department of Community Medicine, Zoram Medical College, Mizoram, 796005, India

    Ganesh Shanmugasundaram Anusuya

  5. Energy and Biophotonics Laboratory, Department of Physics, Academy of Maritime Education and Training (AMET), Kanathur, Tamil Nadu, 603112, India

    Thanigai Arul Kumaravelu

  6. National Isotope Centre, Ion Beam Analysis Research Laboratory, Geological and Nuclear Science , PO Box 31312, Lower Hutt, New Zealand

    John Kennedy

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  1. Manikandan Elayaperumal
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  2. Yaminipriya Vedachalam
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  3. Dhanasekar Loganathan
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  4. Thanigai Arul Kumaravelu
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  5. Ganesh Shanmugasundaram Anusuya
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  6. John Kennedy
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Correspondence to Manikandan Elayaperumal.

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The original version of this article unfortunately contained a mistake. The author Manikandan Elayaperumal should only be affiliated with affiliations 1, 2 and 3. The author group is now corrected

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Elayaperumal, M., Vedachalam, Y., Loganathan, D. et al. Ion Beam Analysis of Proton-Induced X-ray Emission (PIXE) Techniques for Elemental Investigation of Young Stage Neem Leaf of Southern India, Tamil Nadu. Biol Trace Elem Res 199, 3540–3546 (2021). https://doi.org/10.1007/s12011-020-02443-x

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