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High-Resolution Acoustic Emission Monitoring in Nanomechanics

  • New Developments in Nanomechanical Methods
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Abstract

In many cases, the load–depth–time record in a nanomechanical or nanotribological test does not provide sufficient information, and subsequent microscopic imaging does not directly provide information on the dynamics of the process being studied. Analysis of the acoustic waves generated during these tests can overcome this drawback and offer a non-destructive way for obtaining complementary information. Acoustic waves emitted during mechanical tests at the nano/micro scale are a rich source of information about the deformation behavior that can otherwise be inaccessible by traditional methods. Analysis of acoustic emissions (AE) can provide a better understanding and more complex interpretation of nanomechanical and nanotribological results even at the nano/micro scale. In this study, the strength of an AE-based method is demonstrated for various types of materials, including hard SiC coatings, silicalite-1 zeolite microcrystals, Fe3Si bulk and partially stabilized zirconia explored using nano-indentation, nano-scratch tests and repetitive nano-impact tests.

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Acknowledgements

The authors gratefully acknowledge the support by the Project TH03020245 of the Technology Agency of the Czech Republic and the Operational Programme Research, Development and Education, Projects Nos. CZ.02.1.01/0.0/0.0/17_049/0008422 and CZ.02.1.01/0.0/0.0/16_019/0000754 of the Ministry of Education, Youth and Sports of the Czech Republic.

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Authors and Affiliations

  1. Institute of Physics of the Czech Academy of Sciences, Joint Laboratory of Optics of Palacký University and Institute of Physics AS CR, Olomouc, Czech Republic

    Radim Ctvrtlik & Jan Tomastik

  2. Regional Centre of Advanced Technologies and Materials, Joint Laboratory of Optics of Palacky University and Institute of Physics of Academy of Sciences of the Czech Republic, Faculty of Science, Palacky University, 17. listopadu 12, 77146, Olomouc, Czech Republic

    Radim Ctvrtlik & Lukas Vaclavek

  3. Micro Materials Ltd, Willow House, Yale Business Village, Ellice Way, Wrexham, LL13 7YL, UK

    Ben D. Beake, Adrian J. Harris & Alberto Sanchez Martin

  4. ZD Rpety - Dakel, Ohrobecká 408/3, 142 00, Prague, Czech Republic

    Michal Hanak & Petr Abrham

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  1. Radim Ctvrtlik
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Correspondence to Radim Ctvrtlik or Ben D. Beake.

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Ctvrtlik, R., Tomastik, J., Vaclavek, L. et al. High-Resolution Acoustic Emission Monitoring in Nanomechanics. JOM 71, 3358–3367 (2019). https://doi.org/10.1007/s11837-019-03700-8

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