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JOM

, Volume 69, Issue 11, pp 2272–2277 | Cite as

Study on the Structural, Morphological and Optical Properties of RF-Sputtered Dysprosium-Doped Barium Tungstate Thin Films

  • S. Hridya
  • V. S. Kavitha
  • S. R. Chalana
  • R. Reshmi Krishnan
  • R. Sreeja Sreedharan
  • S. Suresh
  • V. P. N. Nampoori
  • S. Sankararaman
  • Radhakrishna Prabhu
  • V. P. Mahadevan Pillai
Article
  • 121 Downloads

Abstract

Barium tungstate films with different Dy3+ doping concentrations, namely 0 wt.%, 1 wt.%, 3 wt.% and 5 wt.%, are deposited on cleaned quartz substrate by radio frequency magnetron sputtering technique and the prepared films are annealed at a temperature of 700°C. The structural, morphological and optical properties of the annealed films are studied using techniques such as x-ray diffraction (XRD), micro-Raman spectroscopy, field emission scanning electron microscopy, atomic force microscopy and photoluminescence spectroscopy. XRD analysis shows that all the films are well-crystallized in nature with a monoclinic barium tungstate phase. The presence of characteristic modes of the tungstate group in the Raman spectra supports the formation of the barium tungstate phase in the films. Scanning electron microscopic images of the films present a uniform dense distribution of well-defined grains with different sizes. All the doped films present a broad emission in the 390–500 nm region and its intensity increases up to 3 wt.% and thereafter decreases due to usual concentration quenching.

References

  1. 1.
    S.H. Yu, M. Antonietti, H. Colfenand, and J. Hartmann, Nano Lett. 3, 379 (2003).CrossRefGoogle Scholar
  2. 2.
    J. Liao, H. You, S. Zhang, J. Jiang, B. Qiu, H. Huang, and H. Wen, J. Rare Earths 29, 623 (2011).CrossRefGoogle Scholar
  3. 3.
    X. Wu, J. Du, H. Li, M. Zhang, B. Xi, H. Fan, Y. Zhu, and Y. Qian, J. Solid State Chem. 180, 3288 (2007).CrossRefGoogle Scholar
  4. 4.
    K. Hong, M. Xie, R. Hu, and H. Wu, Appl. Phys. Lett. 90, 173121 (2007).CrossRefGoogle Scholar
  5. 5.
    T. Tesfamichael, M. Arita, T. Bostrom, and J. Bell, Thin Solid Films 518, 4791 (2010).CrossRefGoogle Scholar
  6. 6.
    R.E. Tanner, A. Szekeres, D. Gogova, and K. Gesheva, Appl. Surf. Sci. 218, 163 (2003).CrossRefGoogle Scholar
  7. 7.
    Y.B. Li, Y. Bando, D. Golberg, and K. Kurashima, Chem. Phys. Lett. 367, 214 (2003).CrossRefGoogle Scholar
  8. 8.
    K.J. Lethy, D. Beena, R. Vinodkumar, V.P. Mahadevan Pillai, V. Ganesan, V. Sathe, and D.M. Phase, J. Appl. Phys. A 91, 637 (2008).CrossRefGoogle Scholar
  9. 9.
    C. Lemire, B.B. Lollman, A.A. Mohammad, E. Gillet, and K. Aguir, Sens. Actuators, B 84, 43 (2001).CrossRefGoogle Scholar
  10. 10.
    V.B. Sreedhar, D. Ramachari, and C.K. Jayasankar, Phys. B 408, 158 (2013).CrossRefGoogle Scholar
  11. 11.
    B.D. Cullity, Elements of X-ray Diffraction, 3rd ed. (New Jersey: Prentice Hall, 1978), p. 170.Google Scholar
  12. 12.
    G.K. Williamson and W.H. Hall, Acta Metall. 1, 22 (1953).CrossRefGoogle Scholar
  13. 13.
    N. Venugopalan Pillai, V.P. Mahadevan Pillai, R. Vinodkumar, I. Navas, V. Ganesan, and P. Koshy, J. Alloy. Compd. 509, 2745 (2011).CrossRefGoogle Scholar
  14. 14.
    S.M. Zawawi, R. Yahya, A. Hassan, H.N.M. EkramulMahmud, and M.N. Daud, Chem. Cent. J. 7, 80 (2013).CrossRefGoogle Scholar
  15. 15.
    R.S. Ajimsha, A.K. Das, B.N. Singh, P. Misra, and L.M. Kukreja, Physica E 42, 1838 (2010).CrossRefGoogle Scholar
  16. 16.
    X. Sun, X. Sun, X. Li, H.E. Jianand, and B. Wang, J. Electronic Materials 43, 3534 (2014).CrossRefGoogle Scholar
  17. 17.
    M. Tyagi and S.C. Sabharwal, J. Lumin. 128, 1528 (2008).CrossRefGoogle Scholar
  18. 18.
    L. Li, W. Zi, G. Li, S. Lan, G. Ji, S. Gan, H. Zouand, and X. Xu, Solid State Chem 191, 1750 (2012).CrossRefGoogle Scholar
  19. 19.
    J.S. Bae, J.C. Park, J.M. Park, B.C. Choi, J.H. Seo, Y.S. Kim, S.S. Yi, and J.H. Jeong, J. Applied Physics. A 78, 877 (2004).CrossRefGoogle Scholar
  20. 20.
    R. SreejaSreedharan, R. Vinodkumar, I. Navas, R. Prabhu, and V.P. Mahadevan Pillai, JOM 68, 341 (2016).CrossRefGoogle Scholar

Copyright information

© The Minerals, Metals & Materials Society 2017

Authors and Affiliations

  • S. Hridya
    • 1
  • V. S. Kavitha
    • 1
  • S. R. Chalana
    • 1
  • R. Reshmi Krishnan
    • 1
  • R. Sreeja Sreedharan
    • 1
  • S. Suresh
    • 1
  • V. P. N. Nampoori
    • 1
  • S. Sankararaman
    • 1
  • Radhakrishna Prabhu
    • 2
  • V. P. Mahadevan Pillai
    • 1
  1. 1.Department of OptoelectronicsUniversity of KeralaKariavattom, ThiruvananthapuramIndia
  2. 2.School of EngineeringRobert Gordon UniversityAberdeenUK

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