JOM

, Volume 68, Issue 11, pp 2737–2741

In situ Measurements of Irradiation-Induced Creep of Nanocrystalline Copper at Elevated Temperatures

  • Sezer Özerinç
  • Robert S. Averback
  • William P. King
Article

DOI: 10.1007/s11837-016-2077-9

Cite this article as:
Özerinç, S., Averback, R.S. & King, W.P. JOM (2016) 68: 2737. doi:10.1007/s11837-016-2077-9
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Abstract

We have measured irradiation-induced creep on nanocrystalline copper micropillars at elevated temperatures. The micropillars, which were ≈1 µm in diameter and ≈2 µm in height, were fabricated from magnetron-sputtered nanocrystalline copper films. The micropillars were compressed during 2.0 MeV Ar+ bombardment and the deformation measured in situ by laser interferometry. The creep rate was measured over the stress range 10–120 MPa at ≈200°C. The results show linear relationships of creep rate with both applied stress and displacement rate, yielding a creep compliance of 0.07 dpa−1 GPa−1 (dpa:displacement per atom). The findings are in good agreement with the previous results obtained using a bulge test on free-standing thin film specimens.

Funding information

Funder NameGrant NumberFunding Note
Basic Energy Sciences
  • DEFG02-05ER46217

Copyright information

© The Minerals, Metals & Materials Society 2016

Authors and Affiliations

  1. 1.Department of Mechanical EngineeringMiddle East Technical UniversityAnkaraTurkey
  2. 2.Department of Materials Science and EngineeringUniversity of Illinois at Urbana-ChampaignUrbanaUSA
  3. 3.Department of Mechanical Science and EngineeringUniversity of Illinois at Urbana-ChampaignUrbanaUSA

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