, Volume 66, Issue 1, pp 165–170 | Cite as

Orientation Mapping via Precession-Enhanced Electron Diffraction and Its Applications in Materials Science

  • J. G. Brons
  • G. B. ThompsonEmail author


Precession-enhanced diffraction (PED) is a transmission electron microscopy technique that allows for pseudo-kinematical diffraction conditions to occur. Using collected spot patterns, PED has successfully been demonstrated to provide for phase and orientation mapping in a variety of materials. One major advantage of PED is the fine spatial resolution, on the order of a few nanometers, allowing previously inaccessible grain boundary orientation mapping of nanostructured materials to be realized. This article provides a basic overview of the emerging technique with selected highlights of its application to materials science and engineering.


Orientation Mapping Spot Pattern Transmission Electron Microscopy Foil Coherent Twin Boundary Ca12Al14O33 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.



G.B. Thompson gratefully thanks Thomas LaGrange of Lawrence Livermore National Laboratory and Edgar Rauch of SIMAP/GPM2 Laboratory, CNRS-Grenoble INP for their technical discussions on the topic of PED. NSF-DMR-1207220 is acknowledged for support in writing this article.


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Copyright information

© The Minerals, Metals & Materials Society 2013

Authors and Affiliations

  1. 1.Department of Materials and Metallurgical EngineeringUniversity of AlabamaTuscaloosaUSA
  2. 2.Seagate TechnologyBloomingtonUSA

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