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Tip dilation and AFM capabilities in the characterization of nanoparticles

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  • Scanning Probe Microscopy for Materials Science
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Abstract

Scanning-probe microscopy has been routinely employed as a surface characterization technique for more than 20 years. Tip deconvolution, the longest-standing problem associated with particle image analysis in atomic force microscopy (AFM), can be solved by scanning a pre-characterized nanosphere prior to imaging unknown particles.

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References

  1. A. Jillavenkatesa, S. Dapkunas, and L. Lum, Particle Size Characterization (Gaithersburg, MD: NIST, 2001).

    Google Scholar 

  2. P. Goodhew, J. Humphreys, and R. Beanland, Electron Microscopy and Analysis (New York, NY: Taylor & Francis, 2001).

    Google Scholar 

  3. J.S. Villarrubia, Surf. Science, 321 (1994), pp. 287–300.

    Article  CAS  Google Scholar 

  4. J.S. Villarrubia, J. Vac. Sci. Technol. B, 14(2) (1996), pp. 1518–1521.

    Article  CAS  Google Scholar 

  5. D. Keller, Surf. Science, 294 (1993), pp. 409–419.

    Article  CAS  Google Scholar 

  6. J.S. Villarrubia, Journal of NIST, 102 (1997), pp. 425–454.

    Google Scholar 

  7. P. West and N. Starostina, “Quantitative and Qualitative Nanopowder Nanoparticle Characterization with AFM,” Proceedings of Advances in Powder Metallurgy & Particulate Materials (Princeton, NJ: Metal Powder Industries Federation, 2006)

    Google Scholar 

  8. C. Ritter et al., Langmuir, 18 (2002), pp. 7798–7803.

    Article  CAS  Google Scholar 

  9. J. Vasenka et al., Biophysical Journal, 65 (1993), pp. 992–997.

    Article  Google Scholar 

  10. T. Dukette and M. Mackay, Nano Lett., 5(9) (2005), pp. 1704–1709.

    Article  PubMed  CAS  Google Scholar 

  11. V. Bykov, A. Gologanov, and V. Shevyakov, Applied Physics A, 66 (1998), pp. 499–502.

    Article  CAS  Google Scholar 

  12. M. Van Cleef et al., Journal of Microscopy, Pt. 1, 181 (1996), pp. 2–9.

    Google Scholar 

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Authors and Affiliations

  1. Pacific Nanotechnology Inc., Irvine, California, 92614, USA

    P. E. West & N. Starostina

  2. Department of Chemical Engineering and Material Science, University of California-Irvine, Irvine, USA

    K. S. Olson & M. L. Mecartney

  3. Claremont Graduate University School of Mathematical Sciences, Claremont, California, USA

    Ch. Wong

Authors
  1. Ch. Wong
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  2. P. E. West
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  3. K. S. Olson
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  4. M. L. Mecartney
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  5. N. Starostina
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Wong, C., West, P.E., Olson, K.S. et al. Tip dilation and AFM capabilities in the characterization of nanoparticles. JOM 59, 12–16 (2007). https://doi.org/10.1007/s11837-007-0003-x

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  • DOI: https://doi.org/10.1007/s11837-007-0003-x

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