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Analysis of principle deviation of subpixel Zernike moments operator

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Abstract

In original Zernike moments subpixel edge operator, ideal step edge model is chosen for calculating four parameters of a pixel point, and therefore principle deviation is caused by edge model. In order to discuss the effect of principle deviation on edge location, sampled edge model is chosen for calculating edge parameters, principle deviation of edge translation l is derived based on Zernike moments edge detection theory, and modified formula of l is given for Zernike moments operator with masks of 5 × 5 size. Both theory analysis and testing result demonstrate that principle deviation is zero when edge translation l is limited in central pixel of a sampled window. In another case, the modification of l should be considered, which results in edge location accuracy of non-subpixel level for this subpixel edge operator.

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References

  1. Hueckel M H, J ACM., 18(1971) 113.

    Article  MATH  Google Scholar 

  2. Sobel I, Computer Graphics and image Processing., 8 (1978), 127.

    Google Scholar 

  3. Canny J, IEEE Transaction on Pattern Analysis Mach. Intell., 8(1986) 679.

    Article  Google Scholar 

  4. Kris J and Dimitris A, IEEE Transaction on Image Processing., 4 (1995) 285.

    Article  Google Scholar 

  5. Edward P L and Owen M R, IEEE Transaction on Pattern Analysis Mach Intell., 11 (1995) 1293.

    Google Scholar 

  6. Ghosal S and Mehrotra R, Pattern Recognition., 26 (1993) 295.

    Article  Google Scholar 

  7. Ghosal S. and Mehrotra R, IEEE Transactions on Image Processing., 6 (1997),781.

    Article  ADS  Google Scholar 

  8. Qu Y D, Cui C S, and Chen S B, Journal of Image and Vision Computing., 23 (2005) 11.

    Article  Google Scholar 

  9. Cui J W and Tan J B, Optical technique[J]., 31 (2005), 779.

    Google Scholar 

Download references

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Authors and Affiliations

  1. School of Material and Engineering, Shenyang University of Technology, Shenyang, 110023, China

    Qu Ying-dong, Li Rong-de, Yuan Xiao-guang, Huang Hong-jun & Li Chen-xi

Authors
  1. Qu Ying-dong
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  2. Li Rong-de
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  3. Yuan Xiao-guang
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  4. Huang Hong-jun
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  5. Li Chen-xi
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Corresponding author

Correspondence to Qu Ying-dong.

Additional information

Supported by National Natural Science Foundation(No.50605045) and Liaoning Province Education Administration Fund (No. 05L307)

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Qu, Yd., Li, Rd., Yuan, Xg. et al. Analysis of principle deviation of subpixel Zernike moments operator. Optoelectron. Lett. 3, 376–380 (2007). https://doi.org/10.1007/s11801-007-6161-9

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  • DOI: https://doi.org/10.1007/s11801-007-6161-9

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