Abstract
A new photoelastic method of obtaining mode I stress intensity factor (SIF) is presented. The method considers the influence of far field stress, σ ox , on the value of SIF. The only information needed for K I calculation is the area between isochromatic fringe loops. The method is examined by two kinds of specimen in different load cases. Experimental results show that it is quite simple and of high precision.
Similar content being viewed by others
References
Ioakimidis N I, Theocaris P S. A simple method for the photoelastic determination of mode I SIF. Engrg Fract Mech, 1978, 10(3): 677–684
Chen Feng. A high precision photoelastic procedure for determination of mode I stress intensity factor K 1. Int J of Fracture, 1996, 80: R55-R58
Chen Feng, Sun Zongqi, Xu J C. An easy method for calculation of mode I stress intensity factor using isochromatic fringe patterns. Int J of fracture, 1997, 87(2): L51-L55
Theocaris P S, Gdoutos E F. A photoelastic determination of K 1 stress intensity factors. Engrg Fract Mech, 1975, 7(2): 423–430
Sanford R J. Application of the least-square method to photoelastic analysis. Experimental Mechanics, 1980, 20(6): 192–197
Rossmanith H P. A hybrid technique for improved K determination from photoelastic data. Int Experimental Mech, 1983, 6: 152–157
Author information
Authors and Affiliations
Additional information
Project supported by the National Natural Science Foundation of China
Synopsis of the first author Chen Feng, associate professor, born in October 1949, worked on experimental fracture mechanics in Sweden from 1990 to 1995 as a visiting scholar. Major research fields include perturbation and weight function method and its application, experimental mechanics, rock fracture mechanmics.
Rights and permissions
About this article
Cite this article
Chen, F., Sun, Z. A simple method of determining stress intensity factor K I from isochromatic fringe loops. J Cent. South Univ. Technol. 5, 124–126 (1998). https://doi.org/10.1007/s11771-998-0052-5
Received:
Issue Date:
DOI: https://doi.org/10.1007/s11771-998-0052-5