Abstract
Accuracy and roughness, proposed by Pawlak(1982), might draw a conclusion inconsistent with our intuition in some cases. This letter analyzes the limitations in these measures and proposes improved accuracy and roughness measures based on information theory.
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References
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Supported in part by the National Natural Science Foundation of China(60073012), Natural Science Foundation of Jiangsu, China(BK2001004), Visiting Scholar Foundation of Key Lab in Wuhan University
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Zhou, Y., Xu, B. Improved accuracy and roughness measures for rough sets. J. of Electron.(China) 19, 320–323 (2002). https://doi.org/10.1007/s11767-002-0059-2
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DOI: https://doi.org/10.1007/s11767-002-0059-2