Abstract
Phase transformations of copper-indium alloy thin films are analyzed by hot-stage x-ray diffraction (XRD) over the temperature range from 30 to 425 °C in controlled ambient. Thin films of Cu/In with a molar ratio of approximately 0.9 were used. In situ experiments were carried out in a reducing hydrogen atmosphere to minimize oxide formation. The as-deposited Cu/In alloy transformed at 150 °C to form Cu11In9. Ramping the temperature to the upper limit of 425 °C revealed an additional transformation at 350 °C to form Cu16In9.
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(DuPont Company Contribution Number: 7722).
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Orbey, N., Birkmire, R.W., Russell, T.W.F. et al. Copper-Indium Alloy Transformations. JPE 21, 509 (2000). https://doi.org/10.1007/s11669-000-0018-2
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DOI: https://doi.org/10.1007/s11669-000-0018-2