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Journal of Failure Analysis and Prevention

, Volume 13, Issue 2, pp 156–158 | Cite as

Industry Updates

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X-rays Help Characterize Organic Transistors

Plastic electronics, in which an organic material replaces silicon, hold promise for low-cost, flexible electronics. But understanding and controlling the microstructures of these materials is an ongoing challenge. With the help of the D1 x-ray beamline at the Cornell High Energy Synchrotron Source (CHESS), Ithaca, N.Y., scientists are closer to designing the perfect organic semiconductor by spatially mapping the microstructure, texture, grain sizes, and grain orientations of organic semiconductor thin films. Detlef Smilgies, senior research associate at CHESS, is co-author of an article in the journal Advanced Materials (Vol. 24, No. 41) that describes this direct structural mapping.

The study’s senior author, Aram Amassian of King Abdullah University of Science and Technology (KAUST), is a former Cornell postdoctoral associate, and the first author, Amassian’s research associate Ruipeng Li, is a former visiting graduate student at CHESS;...

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