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Journal of Failure Analysis and Prevention

, Volume 13, Issue 1, pp 30–32 | Cite as

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Field SEM Released with Expanded Features

Carl Zeiss Microscopy has introduced an extension of its field emission scanning electron microscope (FE-SEM) platform Merlin. The plug-and-play feature allows customers to add and change detectors with minimum effort to handle tasks ranging from simple image capture to extensive material analysis. A large frame store of 32 × 24 k pixels allows imaging of very large areas. New features include in-situ three-dimensional (3-D) surface reconstruction and calculation of 3-D data from 2-D data.

For more information: Carl Zeiss Microscopy, LLC, One Zeiss Drive, Thornwood, NY 10594; tel: 800/233-2343; fax: 914/681-7446; e-mail: info.microscopy.us@zeiss.com; web: http://microscopy.zeiss.com/microscopy/en_de/products/scanning-electron-microscopes/merlin-materials.html.

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© ASM International 2012

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