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Journal of Failure Analysis and Prevention

, Volume 11, Issue 6, pp 578–587 | Cite as

Managing the Unpredictable: A Business Model for Failure Analysis Service

  • C. Boit
  • K. Scholtens
  • R. Weiland
  • S. Görlich
  • D. Schlenker
Feature

Abstract

This article presents a complete business model for failure analysis (FA) as a high tech provider in the world of microelectronics. It starts with the definitions of a business process, and analysis flows as foundation are discussed. Then, a key performance indicator (KPI) based operation is developed. The implementation of such a model in a FA lab is discussed with the interdependencies of workload and cycle times—the pipeline management. This opens the path to quantitative target setting agreements with the customers. A complete system builds a database that can calculate all the parameters for a FA lab tailored exactly to the demand of the customer. Such a database acts as a reference lab and represents best FA practice.

Keywords

Failure analysis Business model Management Key performance indicators Microelectronics 

Notes

Acknowledgments

We want to thank the Infineon FA crew in Munich for making this project happen. This occurred from the phase when it seemed to be only extra overhead work that kept us from doing the analysis job, through all the contradictory and pointless results that may only have told trivial results on a higher level, to the final success with an improved performance and customer reputation. Thanks for your patience, everybody. It paid off with a high level of FA integration at Infineon and appreciation from the executive board.

References

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    Ross, R.: Failure analysis laboratory management. In: Ross, R., Boit, C., Staab, D. (eds.) Microelectronic Failure Analysis Desk Reference, 4th edn, pp. 569–574. ASM International, Materials Park (1999)Google Scholar
  2. 2.
    Boit, C., et al.: Can failure analysis keep pace with IC technology development. In: Proc. 7th IEEE IPFA, Singapore, pp. 9–14 (1999)Google Scholar
  3. 3.
    Brillert, C., et al.: SRAM failure analysis flow. In: Proceedings of 27th ISTFA, p 323–329. ASM International, Materials Park (2001)Google Scholar
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    Egger, P., Burmer, C.: SRAM failure analysis strategy. In: Proc. 29th ISTFA, p. 177 (2003)Google Scholar

Copyright information

© ASM International 2011

Authors and Affiliations

  • C. Boit
    • 1
  • K. Scholtens
    • 2
  • R. Weiland
    • 2
  • S. Görlich
    • 2
  • D. Schlenker
    • 3
  1. 1.TUB Berlin University of TechnologyBerlinGermany
  2. 2.Infineon Technologies AGMunichGermany
  3. 3.Robert BoschReutlingenGermany

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