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37th International Symposium for Testing and Failure Analysis (ISTFA)
McEnery Convention Center, San Jose, CA
“Finding the Invisible Defect” is the theme for 2011 at the premier event for the microelectronics failure analysis community. The ISTFA technical symposia, user groups, education opportunities, and the largest equipment exposition in the industry make ISTFA the best place to learn, network, and further your career.
Contact: ASM Member Service Center, 9639 Kinsman Road, Materials Park, Ohio 44073-0002; tel: 800/336-5152, ext. 0 (toll free in the US and Canada) or 440/338-5151, ext. 0; fax: 440/338-4634; e-mail: firstname.lastname@example.org; web: http://www.asminternational.org/content/Events/istfa/.
Nov 28–Dec 1
5th International Conference on Sensing Technology (ICST2011)
Massey University, Palmerston North, New Zealand
ICST 2011 is intended to provide a common forum for researchers, scientists, engineers, and practitioners throughout the world to...