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Critical Analysis of Wear Mechanisms in Cemented Carbide

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Abstract

Wear phenomena of cemented carbide (94 wt.% WC, 6 wt.% Co) tip of conical picks have been observed by field emission scanning electron microscopy, energy dispersive x-ray spectroscopy (EDS), and x-ray diffraction analysis (XRD). The conical pick is one type of the cutters which are used to excavate soft structure like coal. It has a cone-shaped abrasive part made of cemented carbide (CC). The picks, under study, have been used for coal mining in an underground mine through a continuous miner machine. During the critical analysis of four picks, wear mechanisms are categorized into four parts, such as, cracks, cavity formation in WC grains, grinding effect, and roughness of WC surface. Through a careful examination, the cracking mechanism has been further divided into three parts. They are cracks with overlapping surfaces, crack on a large surface of CC, and cracks in WC grains. In addition, the severe crushing and tearing of WC grains have also been clearly examined. The possible causes of each wear phenomenon have been explained comprehensively. Crushing and corrosion are the two wearing processes which have severely deteriorated the condition of the CC. Corrosion has been easily identified by observing a number of pores and triangular notches in the WC surface. The oxidation of WC grains due to corrosion has been established by EDS and XRD.

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Abbreviations

W:

Tungsten

Co:

Cobalt

WC:

Tungsten carbide

CC:

Cemented carbide

FESEM:

Field emission scanning electron microscopy

EDS:

Energy dispersive x-ray spectroscopy

SDD:

Silicon drift detectors

nm:

Nano-meter

kV:

Kilo-volt

V:

Volt

pA:

Pico-ampere

nA:

Nano-ampere

BSE:

Back scattered electron

STEM:

Scanning transmission electron microscopy

H:

Hydrogen

S:

Sulfur

O:

Oxygen

Fe:

Iron

Cu:

Copper

Cl:

Chlorine

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Dewangan, S., Chattopadhyaya, S. Critical Analysis of Wear Mechanisms in Cemented Carbide. J. of Materi Eng and Perform 24, 2628–2636 (2015). https://doi.org/10.1007/s11665-015-1546-6

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  • DOI: https://doi.org/10.1007/s11665-015-1546-6

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