Abstract
Ag-Sb-Te (AST) thin film was successfully fabricated on a flexible polyimide substrate by using DC magnetron sputtering from the AgSbTe (AST) target. As-deposited samples were annealed at temperatures between 300 and 450°C under vacuum for 30 min. Then, uni-leg AST thin film thermoelectric modules of five elements were fabricated. Thermal annealing induced a change of thermoelectric characteristic of the thin film from p-type material (300–350°C) to n-type material (400–450°C) through the change in structures (amorphous to crystalline, atomic composition ratio and surface roughness, etc.). The highest power factor was 0.97 mW m−1 K−2 and 0.065 mW m−1 K−2 for p-type and n-type, respectively. The maximum power generation of the uni-leg AST thin film thermoelectric module was approximately 0.88 nW for p-type and 0.54 nW for n-type, with a temperature difference of around 20 K.
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Acknowledgments
This work was financially supported by the National Research Council of Thailand (NRCT) and Thailand Research Fund (TRF) through Research Career Development Grant (RSA6180070) and the TRF-MRG Young Scientific Researcher (Grant No. 251 MRG6180007). This study was also partially supported by Vietnam National University Ho Chi Minh City to Center for Innovative Materials and Architectures (INOMAR) under grant number NCM2019-50-01.
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Prainetr, N., Vora-ud, A., Horprathum, M. et al. Transfer of P-type to N-type Thermoelectric Properties of Ag-Sb-Te Thin Film Through Temperature Annealing and Its Electrical Power Generation. J. Electron. Mater. 49, 572–577 (2020). https://doi.org/10.1007/s11664-019-07756-9
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DOI: https://doi.org/10.1007/s11664-019-07756-9