Skip to main content
Log in

High-Frequency Behavior Analysis and Modeling of Silver Plated Printed Circuit Board with Electrochemical Migration

  • Published:
Journal of Electronic Materials Aims and scope Submit manuscript

Abstract

Silver-plated electronic devices are extensively used in microwave circuits. The electrochemical migration of silver in these circuit boards can affect high-frequency characteristics and signal integrity. In this work, the effect of silver migration on signal transmission of printed circuit boards was evaluated using both experimental testing and analytic modeling. The S parameters of circuit boards with silver migration were measured. Based on multi-conductor transmission line theory and electrical properties of dendrite-like electrochemical migrated silver, a distributed parameter circuit model for the circuit board with silver migration was developed. The model results are in good agreement with those obtained from the experimental tests. The results of this investigation provide a better understanding of the high-frequency behavior of a circuit board with silver migration and theoretical support for identifying failure features in fault diagnosis.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. S.C. Del Barrio, T. Holmgaard, M. Christensen, A. Morris, and G.F. Pedersen, Electron. Lett. 50, 1665 (2014).

    Article  Google Scholar 

  2. Y.Y. Lim, M. Aoyagi, Y.M. Goh and C. Liu, IEEE CPMT Symposium Japan, pp. 239–242 (2016).

  3. H. Tsai, T. Chuang, J. Lee, C. Tsai, H. Wang, H. Lin and C. Chang, International Microsystems, Packaging, Assembly and Circuits Technology Conference, pp. 162–165 (2013).

  4. E. Bogatin, Signal and Power Integrity: Simplified, 2nd ed. (London: Pearson Education Inc., 2015).

    Google Scholar 

  5. S. Yang, J. Wu, and A. Christou, Microelectron. Reliab. 46, 1915 (2006).

    Article  CAS  Google Scholar 

  6. S. Yang and A. Christou, IEEE Trans. Device Mater. Reliab. 7, 188 (2007).

    Article  CAS  Google Scholar 

  7. B. Medgyes, B. Illes, and G. Harsanyi, J. Mater. Sci.: Mater. Electron. 23, 551 (2012).

    CAS  Google Scholar 

  8. T. Sekine, J. Sato, Y. Takeda, D. Kumaki, and S. Tokito, ACS Appl. Mater. Interfaces. 10, 16210 (2018).

    Article  CAS  Google Scholar 

  9. C.A. Yang, J. Wu, C.C. Lee, and C.R. Kao, J. Mater. Sci.: Mater. Electron. 29, 13878 (2018).

    CAS  Google Scholar 

  10. D. Wang, Y. Mei, H. Xie, K. Zhang, K. Siow, X. Li, and G. Lu, Mater. Lett. 206, 1 (2017).

    Article  Google Scholar 

  11. Y. Zhou and F. Lan, Trans. China Electrotech. Soc. 31, 114 (2016).

    Google Scholar 

  12. K. Xiao, P. Yi, L. Yan, Z. Bai, C. Dong, P. Dong, and X. Gao, Materials. (2017). https://doi.org/10.3390/ma10070762.

    Article  Google Scholar 

  13. P. Yi, K. Xiao, C. Dong, S. Zou, and X. Li, Bioelectrochemistry 119, 203 (2018).

    Article  CAS  Google Scholar 

  14. Y. Zhou and Y. Huo, J. Mater. Sci.: Mater. Electron. 27, 931 (2016).

    CAS  Google Scholar 

  15. C.R. Paul, Analysis of Multiconductor Transmission Lines, 2nd ed. (London: Wiley, 2008).

    Google Scholar 

Download references

Acknowledgments

This work was supported in part by the National Natural Science Foundations of China (Nos. 51877010, 61674017), in part by Open Fund of State Key Laboratory of Information Photonics and Optical Communication (BUPT), in part by the BUPT Excellent Ph.D. Students Foundation (No. CX2019121), and in part by Auburn University.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Jinchun Gao.

Additional information

Publisher's Note

Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Wang, Z., Gao, J., Zhou, Y. et al. High-Frequency Behavior Analysis and Modeling of Silver Plated Printed Circuit Board with Electrochemical Migration. J. Electron. Mater. 48, 8039–8046 (2019). https://doi.org/10.1007/s11664-019-07651-3

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11664-019-07651-3

Keywords

Navigation