Abstract
The influence of dopant concentration on both in-plane mobility and minority carrier lifetime in long-wave infrared InAs/InAsSb superlattices (SLs) was investigated. Unintentially doped (n-type) and various concentrations of Be-doped (p-type) SLs were characterized using variable-field Hall and photoconductive decay techniques. Minority carrier lifetimes in p-type InAs/InAsSb SLs are observed to decrease with increasing carrier concentration, with the longest lifetime at 77 K determined to be 437 ns, corresponding to a measured carrier concentration of p 0 = 4.1 × 1015 cm−3. Variable-field Hall technique enabled the extraction of in-plane hole, electron, and surface electron transport properties as a function of temperature. In-plane hole mobility is not observed to change with doping level and increases with reducing temperature, reaching a maximum at the lowest temperature measured of 30 K. An activation energy of the Be-dopant is determined to be 3.5 meV from Arrhenius analysis of hole concentration. Minority carrier electrons populations are suppressed at the highest Be-doping levels, but mobility and concentration values are resolved in lower-doped samples. An average surface electron conductivity of 3.54 × 10−4 S at 30 K is determined from the analysis of p-type samples. Effects of passivation treatments on surface conductivity will be presented.
Similar content being viewed by others
References
B.V. Olson, E.A. Shaner, J.K. Kim, J.F. Klem, S.D. Hawkins, L.M. Murray, J.P. Prineas, M.E. Flatté, and T.F. Boggess, Appl. Phys. Lett. 101, 092109 (2012).
E.H. Steenbergen, B.C. Connelly, G.D. Metcalfe, H. Shen, M. Wraback, D. Lubyshev, Y. Qiu, J.M. Fastenau, A.W.K. Liu, S. Elhamri, and O.O. Cellek, Appl. Phys. Lett. 99, 251110 (2011).
T. Schuler-Sandy, S. Myers, B. Klein, N. Gautam, P. Ahirwar, Z.B. Tian, T. Rotter, G. Balakrishnan, E. Plis, and S. Krishna, Appl. Phys. Lett. 101, 071111 (2012).
H.S. Kim, O.O. Cellek, Z.Y. Lin, Z.Y. He, X.H. Zhao, S. Liu, H. Li, and Y.H. Zhang, Appl. Phys. Lett. 101, 161114 (2012).
D. Zuo, P. Qiao, D. Wasserman, and S. Lien Chuang, Appl. Phys. Lett. 106, 071107 (2015).
Z.Y. Lin, S. Liu, E.H. Steenbergen, and Y.H. Zhang, Appl. Phys. Lett. 107, 201107 (2015).
M.R. Wood, K. Kanedy, F. Lopez, M. Weimer, J.F. Klem, S.D. Hawkins, E.A. Shaner, and J.K. Kim, J. Cryst. Growth 425, 110 (2015).
J. Lu, E. Luna, T. Aoki, E.H. Steenbergen, Y.H. Zhang, and D.J. Smith, J. Appl. Phys. 119, 095702 (2016).
D. Lackner, M. Steger, M.L.W. Thewalt, O.J. Pitts, Y.T. Cherng, S.P. Watkins, E. Plis, and S. Krishna, J. Appl. Phys. 111, 034507 (2012).
E.H. Steenbergen, S. Elhamri, W.C. Mitchel, S. Mou, and G.J. Brown, Appl. Phys. Lett. 104, 011104 (2014).
B.C. Connelly, E.H. Steenbergen, H.E. Smith, S. Elhamri, W.C. Mitchel, S. Mou, G.D. Metcalfe, G.J. Brown, and M. Wraback, Phys. Status Solidi (B) 253, 630 (2015).
Y. Lin, D. Wang, D. Donetsky, G. Belenky, H. Hier, W.L. Sarney, and S.P. Svensson, J. Electron. Mater. 43, 3184 (2014).
D.E. Sidor, G.R. Savich, and G.W. Wicks, J. Electron. Mater. 45, 4663 (2016).
S.P. Svensson, F.J. Crowne, H.S. Hier, W.L. Sarney, W.A. Beck, Y. Lin, D. Donetsky, S. Suchalkin, and G. Belenky, Semicond. Sci. Technol. 30, 035018 (2015).
S. Maimon and G.W. Wicks, Appl. Phys. Lett. 89, 151109 (2006).
J.R. Meyer, C.A. Hoffman, F.J. Bartoli, D.A. Arnold, S. Sivananthan, and J.P. Faurie, Semicond. Sci. Technol. 8, 805 (1993).
W.A. Beck and J.R. Anderson, J. Appl. Phys. 62, 541 (1987).
Z. Dziuba and M. Gorska, J. Phys. III 2, 99 (1992).
J. Antoszewski, D.J. Seymour, L. Faraone, J.R. Meyer, and C.A. Hoffman, J. Electron. Mater. 24, 1255 (1995).
N.C. Henry, A. Brown, D.B. Knorr, N. Baril, E. Nallon, J.L. Lenhart, M. Tidrow, and S. Bandara, Appl. Phys. Lett. 108, 011606 (2016).
R.J. Egan, V.W.L. Chin, and T.L. Tansley, Solid State Commun. 93, 553 (1995).
A.E. Brown, Application of Mobility Spectrum Analysis to Modern Multi-layered IR Device Material. Diss. (2016).
U. Kraft, U. Zschieschang, F. Ante, D. Kälblein, C. Kamella, K. Amsharov, M. Jansen, K. Kern, E. Weber, and H. Klauk, J. Mater. Chem. 20, 6416 (2010).
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Brown, A.E., Baril, N., Zuo, D. et al. Characterization of n-Type and p-Type Long-Wave InAs/InAsSb Superlattices. J. Electron. Mater. 46, 5367–5373 (2017). https://doi.org/10.1007/s11664-017-5621-7
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11664-017-5621-7