Journal of Electronic Materials

, Volume 45, Issue 4, pp 2133–2141 | Cite as

Optical Characterization of Si-Based Ge1−x Sn x Alloys with Sn Compositions up to 12%

  • Sattar Al-KabiEmail author
  • Seyed  Amir Ghetmiri
  • Joe Margetis
  • Wei Du
  • Aboozar Mosleh
  • Murtadha Alher
  • Wei Dou
  • Joshua  M. Grant
  • Greg Sun
  • Richard A. Soref
  • John Tolle
  • Baohua Li
  • Mansour Mortazavi
  • Hameed A. Naseem
  • Shui-Qing Yu


Optical properties of germanium tin (Ge1−x Sn x ) alloys have been comprehensively studied with Sn compositions from 0 (Ge) to 12%. Raman spectra of the GeSn samples with various Sn compositions were measured. The room temperature photoluminescence (PL) spectra show a gradual shift of emission peaks towards longer wavelength as Sn composition increases. Temperature dependent PL shows the PL intensity variation along with the temperature change, which reveals the indirectness or directness of the bandgap of the material. As temperature decreases, the PL intensity decreases with Sn composition less than 8%, indicating the indirect bandgap Ge1−x Sn x ; while the PL intensity increases with Sn composition higher than 10%, implying the direct bandgap Ge1−x Sn x . Moreover, the PL study of n-doped samples shows bandgap narrowing compared to the unintentionally (Boron) doped thin film with similar Sn compositions due to the doping.


GeSn alloy n- doped GeSn Raman spectroscopy photoluminescence 



The work in UA is supported by the National Science Foundation (NSF) under EPS-1003970, Defense Advanced Research Projects Agency (DARPA) under W911NF-13-1-0196,the Arktonics, LLC (Air Force SBIR) under FA9550-14-C-0044 and Air Force Office of Scientific Research (AFOSR) under FA9550-14-1-0205. Drs. R. A. Soref and G. Sun acknowledge support from AFOSR under FA9550-14-1-0196.


  1. 1.
    R.A. Soref, MRS Bulletin 23, 20 (1998).CrossRefGoogle Scholar
  2. 2.
    R.A. Soref and L. Friedman, Superlattices Microstruct. 14, 189 (1993).CrossRefGoogle Scholar
  3. 3.
    S.A. Ghetmiri, W. Du, J. Margetis, A. Mosleh, L. Couser, B.R. Conley, L. Domulevicz, A. Nazzal, G. Sun, R.A. Soref, J. Tolle, B. Li, H.A. Naseem, and S. Yu, Appl. Phys. Lett. 105, 151109 (2014).CrossRefGoogle Scholar
  4. 4.
    S.A. Ghetmiri, W. Du, B.R. Conley, A. Mosleh, A. Nazzal, G. Sun, R.A. Soref, J. Margetis, J. Tolle, H.A. Naseem, and S. Yu, J. Vac. Sci. Technol. B 32, 060601 (2014).CrossRefGoogle Scholar
  5. 5.
    S. Wirths, R. Geiger, N. von den Driesch, G. Mussler, T. Stoica, S. Mantl, Z. Ikonic, M. Luysberg, S. Chiussi, and J. Hartmann, Nat. Photonics 9, 88 (2015).CrossRefGoogle Scholar
  6. 6.
    M. Oehme, J. Werner, M. Gollhofer, M. Schmid, M. Kasche, and E. Kasper, IEEE Photon. Technol. Lett. 23, 1751 (2011).CrossRefGoogle Scholar
  7. 7.
    R. Roucka, J. Mathews, R.T. Beeler, J. Tolle, J. Kouvetakis, and J. Menéndez, Appl. Phys. Lett. 98, 061109 (2011).CrossRefGoogle Scholar
  8. 8.
    J.P. Gupta, N. Bhargava, S. Kim, T. Adam, and J. Kolodzey, Appl. Phys. Lett. 102, 251117 (2013).CrossRefGoogle Scholar
  9. 9.
    H.H. Tseng, K.Y. Wu, H. Li, V. Mashanov, H.H. Cheng, G. Sun, and R.A. Soref, Appl. Phys. Lett. 102, 182106 (2013).CrossRefGoogle Scholar
  10. 10.
    W. Du, Y. Zhou, S.A. Ghetmiri, A. Mosleh, B.R. Conley, A. Nazzal, R.A. Soref, G. Sun, J. Tolle, J. Margetis, H.A. Naseem, and S. Yu, Appl. Phys. Lett. 104, 241110 (2014).CrossRefGoogle Scholar
  11. 11.
    E. Kasper and M. Oehme, Jpn. J. Appl. Phys. 54, 04DG11 (2015).Google Scholar
  12. 12.
    J.D. Gallagher, C.L. Senaratne, P. Sims, T. Aoki, J. Menendez, and J. Kouvetakis, Appl. Phys. Lett. 106, 091103 (2015).CrossRefGoogle Scholar
  13. 13.
    M. Oehme, M. Schmid, M. Kaschel, M. Gollhofer, D. Widmann, E. Kasper, and J. Schulze, Appl. Phys. Lett. 101, 141110 (2012).CrossRefGoogle Scholar
  14. 14.
    A. Gassenq, F. Gencarelli, J. Van Campenhout, Y. Shimura, R. Loo, G. Narcy, B. Vincent, and G. Roelkens, Opt. Express 20, 27297 (2012).CrossRefGoogle Scholar
  15. 15.
    S. Su, B. Cheng, C. Xue, W. Wang, Q. Cao, H. Xue, W. Hu, G. Zhang, Y. Zuo, and Q. Wang, Opt. Express 19, 6400 (2011).CrossRefGoogle Scholar
  16. 16.
    H.H. Tseng, H. Li, V. Mashanov, Y.J. Yang, H.H. Cheng, G.E. Chang, R.A. Soref, and G. Sun, Appl. Phys. Lett. 103, 231907 (2013).CrossRefGoogle Scholar
  17. 17.
    D. Zhang, C. Xue, B. Cheng, S. Su, Z. Liu, X. Zhang, G. Zhang, C. Li, and Q. Wang, Appl. Phys. Lett. 102, 141111 (2013).CrossRefGoogle Scholar
  18. 18.
    M. Oehme, K. Kostecki, K. Ye, S. Bechler, K. Ulbricht, M. Schmid, M. Kaschel, M. Gollhofer, R. Körner, W. Zhang, E. Kasper, and J. Schulze, Opt. Express 22, 839 (2014).CrossRefGoogle Scholar
  19. 19.
    B.R. Conley, A. Mosleh, S.A. Ghetmiri, W. Du, R.A. Soref, G. Sun, J. Margetis, J. Tolle, H.A. Naseem, and S. Yu, Opt. Express 22, 15639 (2014).CrossRefGoogle Scholar
  20. 20.
    T.N. Pham, W. Du, B.R. Conley, J. Margetis, G. Sun, R.A. Soref, J. Tolle, B. Li, and S.-Q. Yu, Electron. Lett. 51, 854 (2015).CrossRefGoogle Scholar
  21. 21.
    C. Vedatrayee, B. Mukhapadhyay, and P.K. Basu, Physica E 50, 67 (2013).CrossRefGoogle Scholar
  22. 22.
    R.A. Soref, G. Sun, and H.H. Cheng, J. Appl. Phys. 111, 123113 (2012).CrossRefGoogle Scholar
  23. 23.
    J. Mathews, R.T. Beeler, J. Tolle, C. Xu, R. Roucka, J. Kouvetakis, and J. Menéndez, Appl. Phys. Lett 97, 221912 (2010).CrossRefGoogle Scholar
  24. 24.
    M. Ryu, T.R. Harris, Y.K. Yeo, R.T. Beeler, and J. Kouvetakis, Appl. Phys. Lett. 102, 171908 (2013).CrossRefGoogle Scholar
  25. 25.
    R. Chen, H. Lin, Y. Huo, C. Hitzman, T.I. Kamins, and J.S. Harris, Appl. Phys. Lett. 99, 181125 (2011).CrossRefGoogle Scholar
  26. 26.
    L. Jiang, J.D. Gallagher, C.L. Senaratne, T. Aoki, J. Mathews, J. Kouvetakis, and J. Menéndez, Semicond. Sci. Tech. 29, 115028 (2014).CrossRefGoogle Scholar
  27. 27.
    S. Wirths, R. Geiger, Z. Ikonic, A.T. Tiedemann, G. Mussler, J.M. Hartmann, S. Mantl, H. Sigg, D. Grützmacher, and D. Buca, in IEEE International Conference on Group IV Photonics GFP. IEEE Computer Society (2014)Google Scholar
  28. 28.
    G. Grzybowski, L. Jiang, J. Mathews, R. Roucka, C. Xu, R.T. Beeler, J. Kouvetakis, and J. Menéndez, Appl. Phys. Lett. 99, 171910 (2011).CrossRefGoogle Scholar
  29. 29.
    W. Du, S.A. Ghetmiri, B.R. Conley, A. Mosleh, A. Nazzal, R.A. Soref, G. Sun, J. Tolle, J. Margetis, H.A. Naseem, and S. Yu, Appl. Phys. Lett. 105, 051104 (2014).CrossRefGoogle Scholar
  30. 30.
    T.R. Harris, Y.K. Yeo, M. Ryu, R.T. Beeler, and J. Kouvetakis, J. Appl. Phys. 116, 103502 (2014).CrossRefGoogle Scholar
  31. 31.
    R.T. Beeler, G.J. Grzybowski, R. Roucka, L. Jiang, J. Mathews, D.J. Smith, J. Menendez, A.V.G. Chizmeshya, and J. Kouvetakis, J. Chem. Mater. 23, 4480 (2011).CrossRefGoogle Scholar
  32. 32.
    R.Geiger, T. Zabel, and H. Sigg, Front Mater. v.2 (2015)Google Scholar
  33. 33.
    S. Gupta, B. Magyari-Köpe, Y. Nishi, and K.C. Saraswat, J. Appl. Phys. 113, 073707 (2013).CrossRefGoogle Scholar
  34. 34.
    J. Tolle, S.A. Ghetmiri, W. Du, B.R. Conley, A. Mosleh, R.A. Soref, G. Sun, L. Domulevicz, H.A. Naseem, S. Yu, and J. Margetis, ECS J. Solid State Sci. 64, 711–720 (2014).Google Scholar
  35. 35.
    V.R. D’Costa, J. Tolle, R. Roucka, C.D. Poweleit, J. Kouvetakis, and J. Menéndez, Solid State Commun. 144, 240–244 (2007).CrossRefGoogle Scholar
  36. 36.
    S. Su, W. Wang, B. Cheng, W. Hu, G. Zhang, C. Xue, Y. Zuo, and Q. Wang, Solid State Commun. 151, 647–650 (2011).CrossRefGoogle Scholar
  37. 37.
    A.A. Tonkikh, C. Eisenschmidt, V.G. Talalaev, N.D. Zakharov, J. Schilling, G. Schmidt, and P. Werner, Appl. Phys. Lett. 103, 032106 (2013).CrossRefGoogle Scholar
  38. 38.
    S. Shevchenko and A. Tereshchenko, Phys. Status Solidi 4, 2898 (2007).CrossRefGoogle Scholar

Copyright information

© The Minerals, Metals & Materials Society 2015

Authors and Affiliations

  • Sattar Al-Kabi
    • 1
    • 2
    • 3
    Email author
  • Seyed  Amir Ghetmiri
    • 1
    • 2
  • Joe Margetis
    • 4
  • Wei Du
    • 2
  • Aboozar Mosleh
    • 1
    • 2
  • Murtadha Alher
    • 2
    • 5
  • Wei Dou
    • 2
  • Joshua  M. Grant
    • 1
    • 2
  • Greg Sun
    • 6
  • Richard A. Soref
    • 6
  • John Tolle
    • 4
  • Baohua Li
    • 7
  • Mansour Mortazavi
    • 8
  • Hameed A. Naseem
    • 2
  • Shui-Qing Yu
    • 2
  1. 1.MicroElectronics-Photonics ProgramUniversity of ArkansasFayettevilleUSA
  2. 2.Department of Electrical EngineeringUniversity of ArkansasFayettevilleUSA
  3. 3.Department of PhysicsWasit UniversityKutIraq
  4. 4.ASMPhoenixUSA
  5. 5.Mechanical Engineering DepartmentUniversity of KerbalaKarbalaIraq
  6. 6.Department of EngineeringUniversity of Massachusetts BostonBostonUSA
  7. 7.Arktonics, LLCFayettevilleUSA
  8. 8.Department of Chemistry & PhysicsUniversity of Arkansas at Pine BluffPine BluffUSA

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