Abstract
Recently, much research has been focused on finding new thermoelectric materials. Cu-based quaternary chalcogenides that belong to A2BCD4 (A = Cu; B = Zn, Cd; C = Sn, Ge; D = S, Se, Te) are wide band gap materials and one of the potential thermoelectric materials due to their complex crystal structures. In this study, In-doped quaternary compounds Cu2ZnGe1−x In x Se4 (x = 0, 0.025, 0.05, 0.075, 0.1) were prepared by a solid state synthesis method. Powder x-ray diffraction patterns of all the samples showed a tetragonal crystal structure (space group I-42m) of the main phase with a trace amount of impurity phases, which was further confirmed by Rietveld analysis. The elemental composition of all the samples showed a slight deviation from the nominal composition with the presence of secondary phases. All the transport properties were measured in the temperature range 373–673 K. The electrical resistivity of all the samples initially decreased up to ∼470 K and then increased with increase in temperature upto 673 K, indicating the transition from semiconducting to metallic behavior. Positive Seebeck coefficients for all the samples revealed that holes are the majority carriers in the entire temperature range. The substitution of In3+ on Ge4+ introduces holes and results in the decrease of resistivity as well as the Seebeck coefficient, thereby leading to the optimization of the power factor. The lattice thermal conductivity of all the samples decreased with increasing temperature, indicating the presence of phonon-phonon scattering. As a result, the thermoelectric figure of merit (zT) of the doped sample showed an increase as compared to the undoped compound.
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Acknowledgements
The authors would like to thank the Department of Science & Technology (DST), India for financial support through Grant No. SB/EMEQ-243/2013. The authors would like to thank Mr. Nilanchal Patra and Mr. Sayan Das for helping with Hall measurements.
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Chetty, R., Bali, A., Femi, O.E. et al. Thermoelectric Properties of In-Doped Cu2ZnGeSe4 . J. Electron. Mater. 45, 1625–1632 (2016). https://doi.org/10.1007/s11664-015-4131-8
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DOI: https://doi.org/10.1007/s11664-015-4131-8