Abstract
In this work we deposited c-axis-oriented ZnO films using radiofrequency magnetron sputtering at substrate temperatures from 200°C to 500°C. We then characterized their local piezoelectric properties and polarity distributions using piezoresponse force microscopy, revealing that these ZnO films contained grains with opposite polarities: O-face and Zn-face. The grains with O-face polarity exhibited larger piezoresponse magnitude than those with Zn-face polarity. As the substrate temperature was increased, the predominant polarization orientation of the films changed from O-face to Zn-face. The film deposited at 300°C showed uniform polarization orientation together with higher piezoresponse magnitude.
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U. Ozgur, Y.I. Alivov, C. Liu, A. Teke, M.A. Reshchikov, S. Dogan, V. Avrutin, S.J. Cho, and H. Morkoc, J. Appl. Phys. 98, 041301 (2005).
S.J. Pearton, D.P. Norton, K. Ip, Y.W. Heo, and T. Steiner, Prog. Mater. Sci. 50, 293 (2005).
R. Serhane, S. Abdelli-Messaci, S. Lafane, H. Khales, W. Aouimeur, A. Hassein-Bey, and T. Boutkedjirt, Appl. Surf. Sci. 288, 572 (2014).
Y.Q. Fu, Y. Li, C. Zhao, F. Placido, and A.J. Walton, Appl. Phys. Lett. 101, 194101 (2012).
R. Ro, R. Lee, Z.-X. Lin, C.-C. Sung, Y.-F. Chiang, and S. Wu, Thin Solid Films 529, 470 (2013).
T. Kamohara, M. Akiyama, and N. Kuwano, Appl. Phys. Lett. 92, 093506 (2008).
T. Kamohara, M. Akiyama, N. Ueno, M. Sakamoto, K. Kano, A. Teshigahara, N. Kawahara, and N. Kuwano, Appl. Phys. Lett. 89, 243507 (2006).
J.A. Christman, R.R. Woolcott, A.I. Kingon, and R.J. Nemanich, Appl. Phys. Lett. 73, 3851 (1998).
Y.C. Yang, C. Song, X.H. Wang, F. Zeng, and F. Pan, Appl. Phys. Lett. 92, 012907 (2008).
A. Gruverman and S.V. Kalinin, J. Mater. Sci. 41, 107 (2006).
S.V. Kalinin, A. Rar, and S. Jesse, IEEE Trans. Ultrason. Ferroelectr. 53, 2226 (2006).
D.A. Bonnell, S.V. Kalinin, A.L. Kholkin, and A. Gruverman, MRS Bull. 34, 648 (2009).
T. Jungk, A. Hoffmann, and E. Soergel, Appl. Phys. Lett. 91, 253511 (2007).
P. Bintachitt, S. Trolier-McKinstry, K. Seal, S. Jesse, and S.V. Kalinin, Appl. Phys. Lett. 94, 042906 (2009).
V.V. Shvartsman and A.L. Kholkin, J. Appl. Phys. 108, 042007 (2010).
C. Lichtensteiger, S. Fernandez-Pena, C. Weymann, P. Zubko, and J.-M. Triscone, Nano Lett. 14, 4205 (2014).
I.K. Bdikin, J. Gracio, R. Ayouchi, R. Schwarz, and A.L. Kholkin, Nanotechnology 21, 235703 (2010).
J. Kim, S. Hong, S. Buhlmann, Y. Kim, M. Park, Y.K. Kim, and K. No, J. Appl. Phys. 107, 104112 (2010).
B.J. Rodriguez, A. Gruverman, A.I. Kingon, R.J. Nemanich, and O. Ambacher, Appl. Phys. Lett. 80, 4166 (2002).
L.P. Schuler, N. Valanoor, P. Miller, I. Guy, R.J. Reeves, and M.M. Alkaisi, J. Electron. Mater. 36, 507 (2007).
C.P. Li and B.H. Yang, J. Electron. Mater. 40, 253 (2011).
T. Jungk, A. Hoffmann, and E. Soergel, Appl. Phys. Lett. 89, 163507 (2006).
C.T. Yang, Z.Y. Zeng, Z. Chen, J.S. Liu, and S.R. Zhang, J. Cryst. Growth 293, 299 (2006).
Q.Y. Xu, Y. Wang, X.L. Du, X.L. Du, Q.K. Xue, and Z. Zhang, Appl. Phys. Lett. 84, 2067 (2004).
Acknowledgements
This work was supported by the National High Technology Research and Development Program (“863” Program) of China (No. 2013AA030801), the National Natural Science Foundation (Nos. 61306010 and 61106007), the Natural Science Foundation of Tianjin (No. 13JCZDJC36000), and Outstanding Young University Teacher Foundation of Tianjin.
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Li, C., Dai, W., Xu, S. et al. Local Piezoelectric Properties and Polarity Distribution of ZnO Films Deposited at Different Substrate Temperatures. J. Electron. Mater. 44, 1095–1099 (2015). https://doi.org/10.1007/s11664-015-3659-y
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DOI: https://doi.org/10.1007/s11664-015-3659-y