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Structural Analysis and Dielectric Properties of HoFe1−x Ni x O3 (0 ≤ x ≤ 0.5)

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Abstract

Bulk samples of HoFe1−x Ni x O3 (x = 0, 0.1, 0.3, 0.5) were synthesized through the conventional solid-state reaction route and subjected to various structural and electrical characterization techniques. The x-ray diffraction patterns confirm that the samples exist in a single phase with orthorhombic structure having space group Pbnm. With increasing Ni content, the unit cell volume and lattice parameters undergo small variation, as further confirmed by Raman spectroscopy measurements, especially towards higher wavenumber. Dielectric loss and permittivity measurements were performed at varying temperature and frequency. The permittivity increases with Ni doping. Further, the permittivity and dielectric loss exhibited different behavior with temperature and frequency variation. The alternating-current conductivity results show a small-polaron-type contribution in the conduction mechanism of these orthoferrites.

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Acknowledgements

Financial support in the form of a fellowship from CSIR New Delhi to Z.H. is gratefully acknowledged. We thank IUAC, New Delhi for providing all experimental facilities.

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Authors and Affiliations

  1. Department of Chemistry, National Institute of Technology, Hazratbal, Srinagar, 190006, J&K, India

    Zubida Habib & Kowsar Majid

  2. Department of Physics, National Institute of Technology, Hazratbal, Srinagar, 190006, J&K, India

    M. Ikram

  3. Materials Science Division, Inter University Accelerator Centre, New Delhi, 110067, India

    K. Asokan

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  1. Zubida Habib
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  2. Kowsar Majid
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Correspondence to M. Ikram.

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Habib, Z., Majid, K., M. Ikram et al. Structural Analysis and Dielectric Properties of HoFe1−x Ni x O3 (0 ≤ x ≤ 0.5). J. Electron. Mater. 44, 1044–1053 (2015). https://doi.org/10.1007/s11664-014-3617-0

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  • DOI: https://doi.org/10.1007/s11664-014-3617-0

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