Abstract
A self-separated GaN layer was prepared by hydride vapor phase epitaxy on a large-period square network template. The morphology of the surface formed was consistent with the substrate patterning that comprised terrace and concave. The mixed polarity of the surface was studied by wet etching and micro-Raman scattering. Micro-Raman scattering was performed to investigate the strain distribution of the surface on the front and backside, as well as the cross-section. Differences were observed in the Raman phonon peaks such as the A1(LO), E1(TO), E2(high) phonon, and LO phonon–plasmon mode (LPP−)/A1(TO) peaks between the terrace and concave. The strain distribution varied regularly, which was interpreted based on the facet growth mode.
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Acknowledgements
This work was partly supported by the National Natural Science Foundation of China (Grant No. 61240015), the Natural Science Foundation of Guangdong Province (Grant No. S2012010010030), and the Basic Research Plan Program of Shenzhen City (Grant Nos. JCYJ20120615101957810, JCYJ2013040110051 3002).
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Sui, Y., Wang, B., Zhao, Z. et al. Strain Distribution Across HVPE GaN Layer Grown on Large Square-Patterned Template Studied by Micro-Raman Scattering. J. Electron. Mater. 43, 2715–2722 (2014). https://doi.org/10.1007/s11664-014-3225-z
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DOI: https://doi.org/10.1007/s11664-014-3225-z