Abstract
Interfacial reactions between Sn, Sn-3.0 wt.%Ag-0.5 wt.%Cu (SAC), and Sn-9 wt.%Zn (SZ) lead-free solders and Fe-42 wt.%Ni (alloy 42) substrates at 240°C, 255°C, and 270°C were investigated in this study. FeSn2, (Fe,Ni, Cu)Sn2, and (Ni,Fe)5Zn21 phases were formed, respectively, at the interface in the Sn/alloy 42, SAC/alloy 42, and SZ/alloy 42 couples. As the reaction time and temperature were increased, the layered intermetallic compound (IMC) assumed two distinct structures, i.e., a thicker layer and a pillar-shaped IMC, in all couples. The IMC thickness of these couples increased with the increase of reaction time and temperature. The IMC thickness was also proportional to the square root of the reaction time. The interfacial reaction mechanism of these couples was diffusion controlled.
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References
WEEE Regulations EU-Directive 96/EC (2002).
RoHS Regulations EU-Directive 95/EC (2002).
A.Z. Miric and A. Girusd, Solder. Surf. Mt. Technol. 10, 19 (1998).
R.M. Shalaby, J. Alloy. Compd. 505, 113 (2010).
A.A. El-Daly and A.E. Hammad, J. Alloy. Compd. 505, 793 (2010).
Y.W. Yen, P.H. Tsai, Y.K. Fang, S.C. Lo, Y.H. Hsieh, and C. Lee, J. Alloy. Compd. 503, 25 (2010).
Y.W. Yen, Y.C. Chiang, C.C. Jao, D.W. Liaw, S.C. Lo, and C. Lee, J. Alloy. Compd. 509, 4595 (2011).
M. Yang, M. Li, L. Wang, Y. Fu, J. Kim, and L. Weng, Mater. Lett. 65, 1506 (2011).
L.C. Tsao, C.O. Chu, and S.F. Peng, Microelectron. Eng. 88, 2964 (2011).
Y.W. Yen, P.H. Tsai, Y.K. Fang, B.J. Chen, and C. Lee, J. Alloy. Compd. 517, 111 (2012).
R. J. K. Wassink, Soldering in Electronics (Ayr, Scotland: Electrochemical Publication, 1989), pp. 135–202.
W.R. Johannes and W. Johnson, Int. J. Microcircuits Electron. Packag. 17, 135 (1994).
W. Engelmaier and B. Fueentes, Solder. Surf. Mt. Technol. 7, 20 (1995).
C. Hwang and K. Suganuma, J. Mater. Res. 18, 1202 (2003).
C.W. Hwang and K. Suganuma, Mater. Trans. 45, 714 (2004).
C.W. Hwang, K. Suganuma, E. Saiz, and A.P. Tomsia, Trans. JWRI 30, 167 (2001).
H. Ozaki, T. Yamamoto, T. Sano, A. Hirose, K.F. Kobayashi, M. Ishio, K. Shiomi and A. Hashimoto, Lead-Free Soldering: It is Here to Stay-Applications, Alloy Development, and Impact, ed. M.A. Palmer, I.E. Anderson, and E.J. Cotts (Cincinnati, OH: Materials Science Technical Series MS&T, 2006), p. 147.
J. Liang, N. Dariavach, P. Callahan, and D. Shangguan, Mater. Trans. 47, 317 (2006).
N. Dariavach, P. Callahan, J. Liang, and R. Fournelle, J. Electron. Mater. 35, 1581 (2006).
X.F. Zhang, J.D. Guo, and J.K. Shang, J. Alloy. Compd. 487, 776 (2009).
Y.W. Yen, H.M. Hsiao, S.W. Lin, P.J. Huang, and C. Lee, J. Electron. Mater. 41, 144 (2012).
T.B. Massalski, Binary Alloy Phase Diagrams-CD-ROM (Materials Park, OH: ASM International, 1996).
V. Raghavan, J. Phase Equilib. 24, 558 (2003).
N. Bochvar, L. Rokhlin, Ternary Alloy Systems, ed. G. Effenberg, S. Ilyenko, L. Börnstein, Group IV Physical Chemistry Volume 11D, (2009) pp. 337–351.
X. Su, N.Y. Tang, and J.M. Toguri, J. Phase Equilib. 23, 140 (2002).
G. Reumont, P. Perrot, J.M. Fiorani, and J. Hertz, J. Phase Equilib. 21, 371 (2000).
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Yen, YW., Hsieh, YP., Jao, CC. et al. Interfacial Reactions of Sn, Sn-3.0Ag-0.5Cu, and Sn-9Zn Lead-Free Solders with Fe-42Ni Substrates. J. Electron. Mater. 43, 187–194 (2014). https://doi.org/10.1007/s11664-013-2727-4
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DOI: https://doi.org/10.1007/s11664-013-2727-4