Abstract
All current techniques for ZT measurement are carried out under a small temperature difference, despite the fact that thermoelectric devices are likely to operate under a relatively large temperature difference. In this paper, we describe a new technique which enables ZT measurement under a large temperature difference. The principle of measurement is presented, followed by a proof-of-concept study. The results of this study show that ZT values obtained under a large temperature difference differ significantly from those obtained under small temperature differences. The technique provides a more realistic evaluation of thermoelectric materials and devices.
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Min, G. ZT Measurements Under Large Temperature Differences. J. Electron. Mater. 39, 1782–1785 (2010). https://doi.org/10.1007/s11664-010-1136-1
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DOI: https://doi.org/10.1007/s11664-010-1136-1