The surface morphology of the B-face of (211) cadmium telluride on germanium (211) is investigated by atomic force microscopy (AFM) and generalized ellipsometry (GE). It is apparent that one can obtain roughnesses on the order of two monolayers or less by manipulating the growth conditions. GE confirms that the surfaces are anisotropic. A model based on the Bruggeman effective-medium approximation is used to fit the data and yields values of the roughness that are in good agreement with those found by AFM. In situ data taken during growth are analyzed and a model for them is also proposed to analyze the formation of roughness and its evolution.
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M. Vilela, D.D. Lofgreen, E. P. G. Smith, M. D. Newton, G. M. Venzor, J. M. Peterson, J.J. Franklin, M. Reddy, S. M. Johnson and M. Z. Tirdow, J. Electron. Mat. 37 1465-1470 (2008). doi:10.1007/s11664-008-0443-2
M. Carmody, J. G. Pasko, D. Edwall, R. Bailey, J. Arias, S. Cabelli, J. Bajaj, L. A. Almeida, J. H. Dinan, M. Groenert, A. J. Stoltz, Y. Chen, G. Brill and N. K. Dhar, J. Electron. Mat. 34 832-838 (2005). doi:10.1007/s11664-005-0028-2
S. M. Johnson, A. A. Buell, M. F. Vilela, J. M. Peterson, J. B. Varesi, M. D. Newton, G. M. Venzor, R. E. Bornfreund, W. A. Radford, E. P. G. Smith, J. P. Rosbeck, T. J. De Lyon, J. E. Jensen and V. Nathan, J. Electron. Mat. 33 526–530 (2004). doi:10.1007/s11664-004-0041-x.
J. Singh and J. Arias, J. Vac. Sci. Technol. A 7 2562-2568 (1989). doi:10.1116/1.575797
S. Sivananthan, X. Chu, J. Reno and JP. Faurie, J. Appl. Phys. 60 1359-1396 (1986). doi:10.1063/1.337310
C. Pautet, personal communication
S. Adachi, T. Kimura, and N. Suzuki, J. Appl. Phys. 74 3435 (1993). doi:10.1063/1.354543.
D.E. Aspnes and H. Arwin, J. Vac. Sci. Technol. A 2 1309 (1984). doi:10.1116/1.572400
C. C. Kim and S. Sivananthan, J. Appl. Phys. 78 4003 (1995). doi:10.1063/1.359922
J. Li, J. Chen, N.J. Podraza, and R.W. Collins, Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion (2006), pp. 392–395.
J.A. Zapien, J. Chen, J. Li, J. Inks, N.J. Podraza, C. Chen, J.␣Drayton, A. Vasko, A. Gupta, S.L. Wang, R.W. Collins, and A.D. Compaan, Photovoltaic Specialists Conference, 2005 (2005), pp. 461–464.
S. Dakshina Murthy, I. B. Bhat, J. Cryst. Growth 170 193-197 (1997). doi:10.1016/S0022-0248(96)00610-0
S. Dakshinamurthy and I. Bhat, Journal of Electronic Materials, 27, 521-524 (1998). doi:10.1007/s11664-998-0008-4
G. Badano, X. Baudry, P. Ballet, P. Duvaut, A. Million, E. Micoud, S. Kaismoune, P. Fougères, S. Mibord, P. Tran-Van and A. Etcheberry, J. Elecotron. Mat. 37 1369-1375 (2008). doi:10.1007/s11664-008-0424-5
Harland G. Tompkins and Eugene A. Irene (editors), Handbook of Ellipsometry (Springer, Heidelberg, 2005) 639-641
J.E. Jellison, Thin Solid Films 290–291 (1996) 40–45. doi:10.1016/S0040-6090(96)09009-8
B. Johs, personal communication
Lord Rayleigh, Theory of Sound, Vol.2 (Macmillan, London, 1929), 89-96
S. O. Rice, Commun. Pure Appl. Math. 4, 351 (1951). doi:10.1002/cpa.3160040206
G. R. Valenzuela, IEEE Proc. 58, 1279 (1970). doi:10.1109/PROC.1970.7902
Ralf Schiffer, Appl. Opt., 26 704-712 (1987). doi:10.1364/AO.26.000704
D. Franta and I. Ohlidal, Opt. Comm., 248 459-467 (2005). doi:10.1016/j.optcom.2004.12.016
J. T. Zettler, J. Rumberg, K. Ploska, K. Stahrenberg, M. Pristovsek, W.Richter, M. Wassermeier, P. Schützendübe, J. Behrend and L. Däweritz, Phys. Stat. Sol. (a) 152, 35-47, (1995). doi:10.1002/pssa.2211520104
D. J. De Smet, Surf. Sci., 56, 293-306 (1976). doi:10.1016/0039-6028(76)90454-4
H. Wohler, M. Fritsch, G. Haas, and D. A. Mlynski, J. Opt. Soc. Am. A 8, 536- (1991).
D. W. Berreman, J. Opt. Soc. Am., 62, 502-510 (1972). doi:10.1364/JOSA.62.000502
H. Wohler, G. Haas, M. Fritsch, and D. A. Mlynski, J. Opt. Soc. Am. A 5, 1554- (1988)
P. Petrika, L. P. Biróc, M. Friedc, T. Lohnerc, R. Berger1, C. Schneiderb, J. Gyulaib, and H. Ryssela, Thin Solid Films, 315 186-191 (1998). doi:10.1016/S0040-6090(97)00349-0
H. Fujiwara, Joohyun Koh, P. I. Rovira, and R. W. Collins, Phys. Rev. B, 61, 10832-10884 (2000). doi:10.1103/PhysRevB.61.10832
Charles C. Kim, J. W. Garland, H. Abad, and P. M. Raccah, Phys. Rev. B 45, 11749 – 11767- (1992)
Hiroyuki Fujiwara, M. Kondo, and A. Matsuda, Phys. Rev. B 63, 115306- (2001)
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Badano, G., Baudry, X. & Robin, I.C. In Situ Spectroscopic Ellipsometry of Rough Surfaces: Application to CdTe(211)B/Ge(211) Grown by Molecular-Beam Epitaxy. J. Electron. Mater. 38, 1652–1660 (2009). https://doi.org/10.1007/s11664-009-0783-6
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DOI: https://doi.org/10.1007/s11664-009-0783-6