Journal of Electronic Materials

, Volume 38, Issue 8, pp 1522–1527 | Cite as

AFM Characterization of Raman Laser-Induced Damage on CdZnTe Crystal Surfaces

  • Lucile C. Teague
  • Samantha A. Hawkins
  • Martine C. Duff
  • Michael Groza
  • Vladimir Buliga
  • Arnold Burger
Article

Abstract

Raman laser studies of detector-grade CdZnTe crystals show an increase in intensity of the Te peaks of the Raman spectra even at very low laser powers. In this study, atomic force microscopy (AFM) was used to characterize the extent of damage to the CdZnTe crystal surface following exposure to the Raman laser. AFM images revealed localized surface damage in the areas exposed to the Raman laser beam. Additional studies using conductive-probe AFM techniques provided localized electrical information for the laser-induced Te-rich areas.

Keywords

CZT CdZnTe atomic force microscopy Raman radiation detection 

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References

  1. 1.
    T.E. Schlesinger, J.E. Toney, H. Yoon, E.Y. Lee, B.A. Burnett, L. Franks, R.B. James, Mater. Sci. Eng. Rep. 32, 103–189 (2001) doi:10.1016/S0927-796X(01)00027-4 CrossRefGoogle Scholar
  2. 2.
    J.F. Butler, C. Lingren, F.P. Doty, IEEE Trans. Nucl. Sci 6, 605 (1992) doi:10.1109/23.159673 CrossRefADSGoogle Scholar
  3. 3.
    .E. Bolotnikov, G.S. Camarda, G.A. Carini, Y. Cui, L. Li, R.B. James, Nucl. Instrum. Methods A 571, 687–698 (2007) doi:10.1016/j.nima.2006.11.023 CrossRefADSGoogle Scholar
  4. 4.
    A. Burger, K. Chattopadhyay, H. Chen, X. Ma, J.O. Ndap, M. Schieber, T.E. Schlesinger, H.W. Yao, J. Erickson, R.B. James. Nucl. Instrum. Methods A 448, 586–590 (2000) doi:10.1016/S0168-9002(00)00294-1 CrossRefADSGoogle Scholar
  5. 5.
    G.A. Carini, A.E. Bolotnikov, G.S. Camarda, G.W. Wright, R.B. James, L. Li. Appl. Phys. Lett. 88, 143515 (2006) doi:10.1063/1.2189912 CrossRefADSGoogle Scholar
  6. 6.
    M.C. Duff, D.B. Hunter, A. Burger, M. Groza, V. Buliga, D.R. Black. Appl. Surf. Sci. 254, 2889–2892 (2008)ADSGoogle Scholar
  7. 7.
    T. Wang, W.Q. Jie, D.M. Zeng. Mater. Sci. Eng. A 472, 227–230 (2008) doi:10.1016/j.msea.2007.03.038 CrossRefGoogle Scholar
  8. 8.
    J.R. Heffelfinger, D.L. Medlin, R.B. James. MRS Symp. Ser. 487, 33 (1998)Google Scholar
  9. 9.
    M. Schieber, T.E. Schlesinger, R.B. James, H. Hermon, H. Yoon, M. Goorsky. J. Cryst. Growth 237–239, 2082 (2002) doi:10.1016/S0022-0248(01)02314-4 CrossRefGoogle Scholar
  10. 10.
    J. Shen, D.K. Aidun, L. Regel, W.R. Wilcox. J. Cryst. Growth 132, 250 (1993) doi:10.1016/0022-0248(93)90269-3 CrossRefADSGoogle Scholar
  11. 11.
    C. Szeles, M.C. Driver. SPIE 3446, 1 (1998)ADSGoogle Scholar
  12. 12.
    S.A. Hawkins, E. V. Aleman, M. C. Duff, D. B. Hunter, A. Burger, M. Groza, V. Buliga, and D. R. Black, J. Electron. Mater 37, 1438–1443 (2008) doi:10.1007/s11664-008-0448-x CrossRefADSGoogle Scholar
  13. 13.
    H. Chen, K. Chattopadhyay, K-T. Chen, A. Burger, M.A. George, J.C. Gregory, P.K. Nag, J.J. Weimer, R.B. James, J. Vac. Sci. Technol. A 17(1), 97–101 (1999) doi:10.1116/1.581557 CrossRefADSGoogle Scholar
  14. 14.
    A.E. Bolotnikov, G.S. Camarda, G.A. Carini, Y. Cui, L. Li, R.B. James, Nucl. Instrum. Methods A 579, 120–124 (2007) doi:10.1016/j.nima.2007.04.022 CrossRefADSGoogle Scholar
  15. 15.
    B.A. Brunett, J.M.V. Scyoc, N.R. Hilton, J.C. Lund, R.B. James, T.E. Schlesinger. IEEE Trans. Nucl. Sci. 46, 237–242 (1999) doi:10.1109/23.775521 CrossRefADSGoogle Scholar
  16. 16.
    B.A. Brunett, J.M.V. Scyoc, T.E. Schlesinger, R.B. James. Nucl. Instrum. Methods A 458, 76–84 (2001) doi:10.1016/S0168-9002(00)00854-8 CrossRefADSGoogle Scholar
  17. 17.
    M.C. Duff, D.B. Hunter, A. Burger, M. Groza, J.P. Bradley, G. Giles, Z. Dai, D.R. Black, H. Burdette, and A. Lanzirotti, J. Mater. Res. (2009) (in press).Google Scholar
  18. 18.
    G. Koley, J. Liu, K.C. Mandal, Appl. Phys. Lett 90, 102121 (2007) doi:10.1063/1.2712496 CrossRefADSGoogle Scholar
  19. 19.
    G.A. Carini, A.E. Bolotnikov, G.S. Camarda, R.B. James. Nucl. Instrum. Methods A 579, 120–124 (2007) doi:10.1016/j.nima.2007.04.078 CrossRefADSGoogle Scholar
  20. 20.
    M.C. Duff, D.B. Hunter, P.R. Nuessle, D.R. Black, H. Burdette, J. Woicik, A. Burger, M. Groza, J. Electron. Mater. 36, 1092 (2007) doi:10.1007/s11664-007-0181-x CrossRefADSGoogle Scholar
  21. 21.
    A. Ruzin, I. Torchinski, I. Goldfarb, Semicond. Sci. Technol. 19, 644–647 (2004) doi:10.1088/0268-1242/19/5/014 CrossRefADSGoogle Scholar
  22. 22.
    H. Huang, J. Xu, J. Wang, C. Zhang, Y. Mo, S. Pan, G. Zhang, SPIE Proc 4454, 244 (2001) doi:10.1117/12.448183 CrossRefADSGoogle Scholar
  23. 23.
    S.S. Islam, S. Rath, K.P. Jain, S.C. Abbi, C. Julien, M. Balkanski. Phys. Rev. B 46, 4982 (1992) doi:10.1103/PhysRevB.46.4982 CrossRefADSGoogle Scholar
  24. 24.
    K. Prabakar, S. Venkatachalam, Y.L. Jeyachandran, S.K. Narayandass, D. Mangalaraj. Mater. Sci. Eng. B 107, 99 (2004) doi:10.1016/j.mseb.2003.10.017 CrossRefGoogle Scholar
  25. 25.
    M.G. Sridharan, M. Mekaladevi, S.K. Narayandass, D. Mangalaraj, H. Chul Lee, J. Optoelectron. Adv. Mater 7, 1479 (2005)Google Scholar
  26. 26.
    M.G. Sridharan, S.K. Narayandass, H. Chul Lee. J. Optoelectron. Adv. Mater. 7, 1483 (2005)Google Scholar
  27. 27.
    M.G. Sridharan, S.K. Narayandass, D. Mangalaraj, H. Chul Lee, Vacuum 70, 511 (2003) doi:10.1016/S0042-207X(02)00703-0 CrossRefGoogle Scholar
  28. 28.
    L. Li, F. Lu, C. Lee, G.W. Wright, D.R. Rhiger, S. Sen, K.S. Shah, M.R. Squillante, L. Cirinano, R.B. James, A. Burger, P. Luke, R. Olson, SPIE 4784, 76 (2003) doi:10.1117/12.453826 CrossRefGoogle Scholar
  29. 29.
    A.S. Pine, G. Dresselhaus, Phys. Rev. B 4, 356 (1971) doi:10.1103/PhysRevB.4.356 CrossRefADSGoogle Scholar
  30. 30.
    H.R. Vydyanath, J. Ellsworth, J.J. Kennedy, B. Dean, C.J. Johnson, G.T. Neugebauer, J. Sepich, P.-K. Liao, J. Vac. Sci. Technol. B 10, 1476 (1992) doi:10.1116/1.586275 CrossRefGoogle Scholar

Copyright information

© TMS 2009

Authors and Affiliations

  • Lucile C. Teague
    • 1
  • Samantha A. Hawkins
    • 1
  • Martine C. Duff
    • 1
  • Michael Groza
    • 2
  • Vladimir Buliga
    • 2
  • Arnold Burger
    • 2
  1. 1.Savannah River National LaboratoryAikenUSA
  2. 2.Fisk UniversityNashvilleUSA

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