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A Scanning Probe Microscopy Study of Cd1−x Zn x Te

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The effects of several ex vacuo methods used in the surface preparation of Cd1−x Zn x Te (CZT) have been studied using noncontact atomic force microscopy, scanning tunneling microscopy, and scanning tunneling spectroscopy. Preparation techniques include mechanical lapping, hydroplane bromine-methanol polishing, and in vacuo annealing. The morphology, electrical homogeneity, and local density of states (LDOS) have been studied for each preparation method. Impurities and oxides quickly form on the surface after each preparation method. Annealing in ultrahigh vacuum causes the surface electronic structure to become inhomogeneous whilst the LDOS suggests a compositional change from an oxide surface to p-type CZT.

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Authors and Affiliations

  1. Department of Physics, Durham University, South Road, Durham, DH1 3LE, UK

    C. K. Egan & A. W. Brinkman

  2. Division of Physics and Technology of Nanometer Structures, Department of Solid State Physics, University of Lodz, Pomorska 149/153, 90-236, Lodz, Poland

    P. Dabrowski & Z. Klusek

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  1. C. K. Egan
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  2. P. Dabrowski
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  3. Z. Klusek
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  4. A. W. Brinkman
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Correspondence to C. K. Egan.

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Egan, C.K., Dabrowski, P., Klusek, Z. et al. A Scanning Probe Microscopy Study of Cd1−x Zn x Te. J. Electron. Mater. 38, 1528–1532 (2009). https://doi.org/10.1007/s11664-009-0693-7

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  • DOI: https://doi.org/10.1007/s11664-009-0693-7

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